Transmission-electron diffraction by MeV electron pulses

Murooka, Yoshie; Naruse, Nobuyasu; Sakakihara, Shouichi; Ishimaru, Manabu; Yang, Jing; Tanimura, Katsumi

doi:10.1063/1.3602314

Cited by 124 publications

(94 citation statements)

References 15 publications

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“…10,26,[28][29][30][31][32][33][34][35][36][37] Photoinjectors were originally optimized for operating at 100s of pC or higher bunch charge, while for MeV UED purposes, a few pC or lower per pulse is preferred. A series of new techniques for the generation, control, and characterization of low charge high brightness electron beams has been developed.…”

Section: Introductionmentioning

confidence: 99%

Mega-electron-volt ultrafast electron diffraction at SLAC National Accelerator Laboratory

Weathersby

Brown

Centurion

et al. 2015

Review of Scientific Instruments

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Ultrafast electron probes are powerful tools, complementary to x-ray free-electron lasers, used to study structural dynamics in material, chemical, and biological sciences. High brightness, relativistic electron beams with femtosecond pulse duration can resolve details of the dynamic processes on atomic time and length scales. SLAC National Accelerator Laboratory recently launched the Ultrafast Electron Diffraction (UED) and microscopy Initiative aiming at developing the next generation ultrafast electron scattering instruments. As the first stage of the Initiative, a mega-electron-volt (MeV) UED system has been constructed and commissioned to serve ultrafast science experiments and instrumentation development. The system operates at 120-Hz repetition rate with outstanding performance. In this paper, we report on the SLAC MeV UED system and its performance, including the reciprocal space resolution, temporal resolution, and machine stability. C 2015 AIP Publishing LLC. [http://dx

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Section: Introductionmentioning

confidence: 99%

Mega-electron-volt ultrafast electron diffraction at SLAC National Accelerator Laboratory

Weathersby

Brown

Centurion

et al. 2015

Review of Scientific Instruments

Self Cite

383

251

View full text Add to dashboard Cite

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“…Pulsed electron and X-ray sources have recently matured to a state where many ultrafast structural phenomena in crystalline matter can be monitored with sufficient spatial and temporal resolution to fully resolve the key modes in transitions to extreme states of matter, 1-3 structure order parameters in strongly correlated electron lattices, [4][5][6] and molecular motions in organic crystals. 7 In particular, X-FELs (X-ray Free Electron Lasers), radio frequency (RF) accelerated, [8][9][10] and RF compressed [11][12][13] electron sources have recently emerged as the flagship technologies in the field, boosting the probe brightness by orders of magnitude to enable entire crystal projections to be captured in a single pulse. However, RF based sources still suffer from a major complication: the synchronization between the laser oscillator and RF electronics.…”

mentioning

confidence: 99%

Single shot time stamping of ultrabright radio frequency compressed electron pulses

Gao

Jiang

Kassier

et al. 2013

Applied Physics Letters

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We demonstrate a method of time-stamping Radio Frequency compressed electron bunches for Ultrafast Electron Diffraction experiments in the sub-pC regime. We use an in-situ ultra-stable photo-triggered streak camera to directly track the time of arrival of each electron pulse and correct for the timing jitter in the radio frequency synchronization. We show that we can correct for timing jitter down to 30 fs root-mean-square with minimal distortion to the diffraction patterns, and performed a proof-of-principle experiment by measuring the ultrafast electron-phonon coupling dynamics of silicon

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“…Therefore here we consider a 100 fs electron-beam pulse, which provides a conservative estimate of the pulse duration required to outrun damage using electron beams, and for which experimental data exists. For such a system [11], experimental measurements give a current density 'j' of 5.3×10 8 We assume initially that the number of electrons per pulse is only weakly dependent on the transverse beam diameter and mostly affects the electron bunch length, as discussed in [12] due to longitudinal space charge effects. In fact this beam is always larger than the single particle.…”

Section: Introductionmentioning

confidence: 99%

“…We consider two cases, with beam diameters D=2R=500 μm (as for the measurements in [11], and R=r, for the idealized case where the beam could be focused down to the size of a virus (the largest viruses have diameter about 0.45 μm).…”

Section: Introductionmentioning

confidence: 99%

Hollow cone illumination for fast TEM, and outrunning damage with electrons

Spence

Subramanian

Musumeci

2015

J. Phys. B: At. Mol. Opt. Phys.

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We consider the possibility of imaging individual bioparticles using snapshot diffraction from femotsecond pulses, using a 3 MeV electron beam, based on the recent experimental performance of these coherent beams. Assuming that radiation damage can be outrun using 100 fs pulses (or less), we find that a sufficient number of electrons are scattered per particle only if the beam diameter can be matched to that of the particle (e.g. a virus), about three orders of magnitude smaller than has currently been demonstrated (and limited by space-charge effects). We then propose the use of the hollow-cone illumination mode for fast transmission electron microscope imaging, because it can provide full-field atomic resolution imaging despite the use of the large incoherent annular source required for an efficient photocathode, so that coherent illumination is not needed for high-resolution imaging. Reciprocity arguments are used to compare this full-field mode with data aquisition times and source brightness in scanning transmission electron microscopy.

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Transmission-electron diffraction by MeV electron pulses

Cited by 124 publications

References 15 publications

Mega-electron-volt ultrafast electron diffraction at SLAC National Accelerator Laboratory

Mega-electron-volt ultrafast electron diffraction at SLAC National Accelerator Laboratory

Single shot time stamping of ultrabright radio frequency compressed electron pulses

Hollow cone illumination for fast TEM, and outrunning damage with electrons

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