2014
DOI: 10.1098/rstb.2013.0322
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Transmission electron microscopy as a tool for nanocrystal characterization pre- and post-injector

Abstract: Recent advancements at the Linac Coherent Light Source X-ray free-electron laser (XFEL) enabling successful serial femtosecond diffraction experiments using nanometre-sized crystals (NCs) have opened up the possibility of X-ray structure determination of proteins that produce only submicrometre crystals such as many membrane proteins. Careful crystal pre-characterization including compatibility testing of the sample delivery method is essential to ensure efficient use of the limited beamtime available at XFEL … Show more

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Cited by 24 publications
(25 citation statements)
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“…Diffraction patterns of superior resolution (3.3 Å) were observed when using the microdiffractometer setup at LCLS XPP at 100 K than were previously measured at LCLS-CXI or at the synchrotron (Table S2). The lower diffraction resolution observed (4.0 Å) during screening experiments at LCLS CXI using smaller crystals and the GDVN injector suggests that a larger sample volume may be required to obtain higher resolution diffraction, or that the crystals were damaged during injection, potentially a consequence of their high solvent content (24). The best diffraction resolution (3.7 Å) observed at SSRL BL12-2 from these crystals (grown in same crystallization batch as used at LCLS XPP), suggests that Pol II-TFIIB-NAS crystals suffer significant radiation damage during the exposure time needed to deliver an equivalent dose at a synchrotron.…”
Section: Raster Data Collectionmentioning
confidence: 98%
See 1 more Smart Citation
“…Diffraction patterns of superior resolution (3.3 Å) were observed when using the microdiffractometer setup at LCLS XPP at 100 K than were previously measured at LCLS-CXI or at the synchrotron (Table S2). The lower diffraction resolution observed (4.0 Å) during screening experiments at LCLS CXI using smaller crystals and the GDVN injector suggests that a larger sample volume may be required to obtain higher resolution diffraction, or that the crystals were damaged during injection, potentially a consequence of their high solvent content (24). The best diffraction resolution (3.7 Å) observed at SSRL BL12-2 from these crystals (grown in same crystallization batch as used at LCLS XPP), suggests that Pol II-TFIIB-NAS crystals suffer significant radiation damage during the exposure time needed to deliver an equivalent dose at a synchrotron.…”
Section: Raster Data Collectionmentioning
confidence: 98%
“…However, there are different and often more complex optimization steps associated with specific injector technologies. Solutions containing a mixture of crystal sizes may require filtering to avoid clogging in the injector nozzle, and delicate crystals may be damaged from the pressures and shear forces of the delivery process itself (24). For experiments conducted in vacuo, stream formation may be disrupted by solution bubbling, drying, or freezing as it exits the injector and enters the vacuum chamber.…”
Section: Significancementioning
confidence: 99%
“…It was immediately realized that the high spatial coherence provided new approaches to the phase problem, for both SPs (Loh [7], Ourmazd and co-workers [8], Martin [9], Schwander et al [16]) and nanocrystals (Millane & Chen [17], Kirian et al [18], Spence et al [19] and Barty et al [20]). Atomic resolution has so far been obtained from unknown structures only using nanocrystals (and near-atomic resolution in the FSS when small changes in a known structure are studied), so that a crucial area for development of the BioXFEL field is the development of new methods for growing nanocrystals (Kupitz et al [21], Caffrey et al [22], Gallat et al [23] and Stevenson et al [24]). When the study of the evolving damage processes (reviewed by Chapman et al [3]), diffraction physics (White [25]), simultaneous emission spectroscopy (Kern et al [15]) and detector development (Denes [26]) is added to this list of subfields, it will be seen that structure and dynamics in biology with XFELs is an extremely rich interdisciplinary field, now undergoing rapid innovation and creative development.…”
mentioning
confidence: 99%
“…The most important characteristics in this optimization are size distribution, density and, of course, diffraction quality. Size distribution for submicron crystals can be obtained using dynamic light scattering [29,45], Nanosight [33,46] or electron microscopy [47]. A new microfluidic technique even allows inert post crystallization sorting using dielectrophoresis [35].…”
Section: Growth and Biophysical Characterization Of Nanocrystalsmentioning
confidence: 99%
“…A new microfluidic technique even allows inert post crystallization sorting using dielectrophoresis [35]. Electron microscopy is an excellent characterization tool for nanocrystals, allowing predicted diffraction quality, analysis of size distribution and permitting comparison of samples at various stages in the sample preparation and subsequent experiment [47] (see Fig. 4).…”
Section: Growth and Biophysical Characterization Of Nanocrystalsmentioning
confidence: 99%