The basic mechanisms driving the collapse of point defects produced in collision cascades are investigated by transmission electron microscope (TEM) characterization of defect microstructures produced in fcc-Cu irradiated with low-fluences of heavy (100 keV Kr) ions at elevated temperature (23–600°C). Areal defect yields are determined from direct TEM observation of the total defect production integrated over the duration of the in-situ ion-irradiation. They are unequivocally demonstrated to decrease with increasing lattice temperature. This decrease in defect yield indicates a proportional decrease in the probability of collapse of cascade regions into defects of size where visible contrast is produced in a TEM.