Highly conducting metal-film subwavelength hole arrays, lithographically fabricated on highresistivity silicon wafers in optical contact with thick silicon plates, have been characterized by terahertz time-domain spectroscopy with subpicosecond resolution and over a frequency range from 0.5 to 3 THz with 5 GHz resolution. Awell-defined ringing structure extending to more than 250 psec is observed on the trailing edge of the transmitted THz pulse. In the frequency domain this ringing structure corresponds to a new type of extremely sharp resonant line structure between the fundamental surface plasmon modes of the hole array. A simple theoretical model is presented and shows good agreement with the experimental data. DOI: 10.1103/PhysRevLett.93.196804 PACS numbers: 73.20.Mf, 41.20.Jb, 42.25.Fx, 78.47.+p Although the microwave and terahertz transmission through thin-metal films or metal foils perforated periodically with apertures has been studied since 1967 [1][2][3][4][5][6], unusual high-transmission resonances through subwavelength hole arrays were only recently discovered [7,8] at optical frequencies. These resonances occurred at wavelengths different from those predicted by the classic diffraction theory [2]. Since this discovery much work has been done to experimentally characterize the transmission of thin subwavelength hole arrays in the optical [9-21], infrared [22], and THz [23][24][25][26][27][28] regions. The enhanced transmission is now understood to be due to the excitation of surface plasmon (SP) resonances [7][8][9][10][11][12][13][14][15][16][17][18][19][20][21][22]24,25,[27][28][29][30][31][32][33]. The SP enhancement can be affected by the refractive index of the adjacent medium [9,12], the shape and orientation of the holes [10,20,27], and the thickness of the metal film [16]. In all these measurements, SP enhanced transmission has been observed only at the frequencies determined by the integral order SP modes coupled to the array [7,8]. Here, we present observations of a new type of high-transmission, extremely narrow resonances at frequencies between those of the integral order SP modes. These resonances correspond to SP propagation in directions different than those allowed by the integral order modes. We call these resonances fractional order surface plasmons (FSP), which are made possible by the high conductivity of metal films at THz frequencies.In this Letter, we present a time-domain and frequency-domain study of the amplitude and phase transmission properties of a thin-metal-film subwavelength hole array, lithographically fabricated on a silicon wafer. The utilized THz time-domain spectroscopy (THz-TDS) technique measures the complete THz electric field pulse with subpicosecond time resolution [34]. For this characterization a subpicosecond THz pulse is incident on the hole array. The transmitted THz pulse consisted of an attenuated subpicosecond pulse due to the classical electromagnetic transmission of the array, followed by a dramatic ringing structure, extending to approximatel...