In the present work, an evaluation of the relaxation behavior of a system (LiCo 3/5 Fe 1/5 Cu 1/5 VO 4 ) has been undertaken. This system was synthesized by solution-based chemical route. Dielectric measurements were made using complex impedance method. Frequency dependence of real part of dielectric constant (ε r ' ) at different temperatures indicates the features of dielectric materials. Temperature dependence of ε r ' at different frequencies shows the dielectric anomalies in ε r ' at different temperatures. Frequency dependence of tangent loss at different temperatures exhibits dielectric relaxation process in the material. The scaling behavior of tangent loss signifies the similar mechanism for relaxation process at various temperatures.