A n investigation of the effect of addition of Bi impurities on the electrical, optical and thermoelectric properties of vacuum evaporated amorphous thin films of Ge,,Te,,_,Bi, (x = 0, 0.19, 2.93 and 7.35) has been carried out. The synthesized thin films were characterized by x-ray diffraction and electron probe microanalysis. Analysis of the results revealed that Bi modification of the amorphous semiconducting thin films does not induce a clear-cut carrier sign reversal. This is in contrast to the observation of a p-n transition i n bulk glassy compositions Ge,Te,,-,Bi, at x = 3.5. This dissimilarity may be explained by the fact that t h e bonding in the bulk glass and the corresponding thin film may be different. This fact is possibly responsible for creation of some additional Bi-induced p-type defects with increase in Bi concentration. The optical energy gap has been found to be approximately equal to twice the thermal activation energy in all t h e four compositions studied in this work.