2004
DOI: 10.1103/physrevb.70.214528
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Transport properties ofNd1.2Ba1.8Cu3OZultrathin films by field-effect doping

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Cited by 19 publications
(13 citation statements)
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“…On the other hand, the complex vortex dynamics, poor flux pinning and weak intergrain links are major limiting factors. Substitutions like oxides [11][12][13], nanoparticles and carbon nanotubes (CNT) [14,15] and metals [16][17][18][19][20][21] in cuprates have enhanced their prospectus for promising applications. It is found that Y in Y-123 system could be replaced by almost all the rare earth (RE) (Gd, Ho, Nb etc) elements [16][17][18].…”
Section: Introductionmentioning
confidence: 99%
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“…On the other hand, the complex vortex dynamics, poor flux pinning and weak intergrain links are major limiting factors. Substitutions like oxides [11][12][13], nanoparticles and carbon nanotubes (CNT) [14,15] and metals [16][17][18][19][20][21] in cuprates have enhanced their prospectus for promising applications. It is found that Y in Y-123 system could be replaced by almost all the rare earth (RE) (Gd, Ho, Nb etc) elements [16][17][18].…”
Section: Introductionmentioning
confidence: 99%
“…Substitutions like oxides [11][12][13], nanoparticles and carbon nanotubes (CNT) [14,15] and metals [16][17][18][19][20][21] in cuprates have enhanced their prospectus for promising applications. It is found that Y in Y-123 system could be replaced by almost all the rare earth (RE) (Gd, Ho, Nb etc) elements [16][17][18]. Doping of Gd [16], Ho [17], Nb [18] and composites with NiO [11], graphene [14], Au [19], graphene oxide [22] have resulted in the enhancement of flux pinning.…”
Section: Introductionmentioning
confidence: 99%
“…The localization length increases as long as the negative gate voltage increases, i.e. by injecting holes in the sample [6].…”
Section: A Device Preparation and R(t) Measurementsmentioning
confidence: 99%
“…NdBCO films are superconductors as long as their thickness is greater than 10 u.c., whereas thinner samples show an insulating behavior following the Variable Range Hopping (VRH) Mott-2D model, described by the equation [6]:…”
Section: A Device Preparation and R(t) Measurementsmentioning
confidence: 99%
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