1995
DOI: 10.1103/physrevb.51.13533
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Transverse diffusion of minority carriers confined near the GaAs surface plane

Abstract: Spatially separated second-harmonic generating and photocarrier exciting light beams were employed to study transverse diffusion of carriers confined near GaAs(001) surfaces. The measurements utilize the intrinsic sensitivity of second-harmonic generation to surface charge density in order to probe these processes. Carrier transport was found to be difFusive with small efFective difFusion coefIicients compared to those of carriers in the bulk. Several models are considered to explain these results.Many years a… Show more

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Cited by 4 publications
(10 citation statements)
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“…In particular, by tracking the evolution of different interfacial fields contributing to total EFISHG signal we are able to study the redistribution of carriers between the layers due to electron transport across interfaces. Note that the carrier transverse diffusion on GaAs surface plane was demonstrated previously in pump-probe spatially separated SHG experiment [13]. However, to the best of our knowledge, the optical detection of interlayer electron transport in semiconductor heterostructures has not been reported before.…”
mentioning
confidence: 58%
“…In particular, by tracking the evolution of different interfacial fields contributing to total EFISHG signal we are able to study the redistribution of carriers between the layers due to electron transport across interfaces. Note that the carrier transverse diffusion on GaAs surface plane was demonstrated previously in pump-probe spatially separated SHG experiment [13]. However, to the best of our knowledge, the optical detection of interlayer electron transport in semiconductor heterostructures has not been reported before.…”
mentioning
confidence: 58%
“…For instance, the effective diffusion constant near the surfaces is more than 3 orders of magnitude smaller than in the bulk for GaAs. 27 For the PEA-terminated MAPbI 3 microplate shown in Figure 4c−f, the bulk carriers have a D of 1.03 ± 0.01 cm 2 s −1 , similar to that of the reference sample, which confirms that the carrier transport properties of the bulk do not change significantly upon surface functionalization. With a pump photon energy of 3.10 eV, D is measured to be 1.05 ± 0.01 cm 2 s −1 for the nearsurface carriers in the same microplate (Figure 4f), which indicates that the carrier diffusion constant in the near-surface region is fully restored to the bulk value by surface functionalization with PEA cations.…”
Section: Sample Preparation and Surface Characterizationsmentioning
confidence: 79%
“…where D 0 is the diffusion constant for the free carriers, τ t is the average time carriers stay in the traps, and τ f is the time for the carriers to be released from the traps. 27 Overall, PEA surface functionalization can lead to improved optoelectronic devices because of two key factors: the reduced surface trap density and the enhanced in-plane near-surface carrier diffusion. The elimination of surface traps is critical for allowing the carriers to diffuse into the bulk, which is necessary for the function of solar cells.…”
Section: ■ Discussionmentioning
confidence: 99%
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