1962
DOI: 10.1063/1.1728818
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Trap Density Determination by Space-Charge-Limited Currents

Abstract: Trap depths and densities can be determined from the analysis of the dependence of space-charge-limited currents on applied electric field in insulators. Values obtained from space-charge-limited current measurements are compared with those obtained from thermally stimulated currents and from photocurrent decay on the same crystal of cadmium sulfide. The results indicate that gross errors in trap depth and density can be made if it is simply assumed that the rapid rise in current toward the trap-free curve wit… Show more

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Cited by 735 publications
(533 citation statements)
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“…Figure 8 shows the typical dark J–V characteristics of electron-only devices with the perovskite film annealed at 100 and 130 °C. The trap densities were estimated by the space charge–limited current (SCLC) model [40]. The linear region at low bias corresponds to the ohmic response.…”
Section: Resultsmentioning
confidence: 99%
“…Figure 8 shows the typical dark J–V characteristics of electron-only devices with the perovskite film annealed at 100 and 130 °C. The trap densities were estimated by the space charge–limited current (SCLC) model [40]. The linear region at low bias corresponds to the ohmic response.…”
Section: Resultsmentioning
confidence: 99%
“…The trap-state density was determined by the trapfilled limit voltage using equation [37] 2 t 0 r TFL 2 Sci.…”
Section: Doi: 101002/advs201800793mentioning
confidence: 99%
“…Moreover it represents a straightforward tool to prove the consistency of the experi- mental results with the simple Mott-Gurney discrete trap SCLC model and to exclude any misinterpretation of the data, such as assigning the square-law dependence to a discrete trap level instead of a monotonously increasing slope, 10 followed by double injection effects. 9,23,24 In the framework of the SCLC analysis, using the zerotemperature statistic, it is possible to estimate the parameters of an arbitrary distribution of traps, knowing the function describing the distribution h͑E F ͒…”
Section: Space-charge-limited Current Differential Method: the Dismentioning
confidence: 99%