2013
DOI: 10.1063/1.4809948
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Trap state controlled bipolar resistive switching effect and electronic transport in LaAlO3/Nb:SrTiO3 heterostructures

Abstract: Trap-assisted tunneling resistance switching effect in CeO2/La0.7(Sr0.1Ca0.9)0.3MnO3 heterostructure Appl.

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Cited by 25 publications
(13 citation statements)
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“…[31][32][33] It is known that the defects, such as the oxygen vacancies (VO), can be present in the LAO layer during film growth and form localized states (LS) in the LAO band gap. [34][35][36][37] Hence, the IET process via these LS [31][32][33][38][39][40] via LS is the main mechanism of the spin transmission through the LAO layer, the SOT efficiency is expected to exhibit a very strong temperature dependence as indicated by the Glazman-Matveev (GM) theory, 31,33,38,41 , which describes the IET with a power law dependence on temperature.…”
mentioning
confidence: 99%
“…[31][32][33] It is known that the defects, such as the oxygen vacancies (VO), can be present in the LAO layer during film growth and form localized states (LS) in the LAO band gap. [34][35][36][37] Hence, the IET process via these LS [31][32][33][38][39][40] via LS is the main mechanism of the spin transmission through the LAO layer, the SOT efficiency is expected to exhibit a very strong temperature dependence as indicated by the Glazman-Matveev (GM) theory, 31,33,38,41 , which describes the IET with a power law dependence on temperature.…”
mentioning
confidence: 99%
“…It is well accepted that the interface state seriously affects the formation of the Schottky barrier, and the field-induced metastable modification of the interface state contributes to the memory effect18. For example, a metal-ferroelectric Schottky junction allows the charge redistribution at the junction interface due to the polarization reversion and as a result modulates the interfacial states as well as the interface barrier, inducing the nonvolatile resistance switching1019. Ferroelectrics usually have very large resistivity due to the large band gap20, while a large resistance of ferroelectric film would reduce or even conceal the differences between the HRS and LRS of whole metal-ferroelectric structure.…”
mentioning
confidence: 99%
“…So far the mechanisms of RS, which are related to some important scientific issues and also significant for applications of RS, have not been solved . Diverse mechanisms have been proposed to explain the observed RS effect, including formation/rupture of conducting filaments, alteration of Schottky barrier, and trapping/detrapping of charge carriers . Among them, the conducting filament model is the most extensive and popular one, which involves unique physics, including nonequilibrium steady states and strongly interacting electrons. , Rich and interesting phenomena, such as conductance quantization, , magnetoresistance, and superconductivity, have been shown because of the various types of filaments.…”
Section: Introductionmentioning
confidence: 99%