2013
DOI: 10.1063/1.4852017
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Trapping ultracold gases near cryogenic materials with rapid reconfigurability

Abstract: We demonstrate a novel atom chip trapping system that allows the placement and high-resolution imaging of ultracold atoms within microns from any 100 µm-thin, UHV-compatible material, while also allowing sample exchange with minimal experimental downtime. The sample is not connected to the atom chip, allowing rapid exchange without perturbing the atom chip or laser cooling apparatus. Exchange of the sample and retrapping of atoms has been performed within a week turnaround, limited only by chamber baking. More… Show more

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Cited by 21 publications
(39 citation statements)
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“…The SQCRAMscope allows any approximately 1-cm 2 area, ≤150-μm-thin sample made of UHV-compatible material to be imaged from room temperature to cryogenic temperatures. We demonstrate here the functionality of the SQCRAMscope at room temperature and 35 K (see Appendix A) and believe operation down to approximately 4 K will soon be possible with the addition of a heat shield [10]. Lastly, we mention that because what the SQCRAMscope measures are nanotesla-strength, shortwavelength deviations in the mean field along the trap axis, the microscope is insensitive to much larger-up to hundreds of gauss-background or long-wavelength fluctuating fields along this axis.…”
Section: Comparison To Other Techniquesmentioning
confidence: 99%
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“…The SQCRAMscope allows any approximately 1-cm 2 area, ≤150-μm-thin sample made of UHV-compatible material to be imaged from room temperature to cryogenic temperatures. We demonstrate here the functionality of the SQCRAMscope at room temperature and 35 K (see Appendix A) and believe operation down to approximately 4 K will soon be possible with the addition of a heat shield [10]. Lastly, we mention that because what the SQCRAMscope measures are nanotesla-strength, shortwavelength deviations in the mean field along the trap axis, the microscope is insensitive to much larger-up to hundreds of gauss-background or long-wavelength fluctuating fields along this axis.…”
Section: Comparison To Other Techniquesmentioning
confidence: 99%
“…See Ref. [10] for more details. We verify that the quasi-1D BEC located below the calibration wires is not fragmented by meandering currents in the atom chip's microwires at this far distance.…”
Section: Calibration Samplementioning
confidence: 99%
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