This article explores the potential of kernel-based methods for fault diagnosis in batch process monitoring by combining Kernel-Principal Component Analysis and three common techniques which permit to analyze batch data by means of bilinear models: variable-wise unfolding, batchwise unfolding and landmark feature extraction. Gower's idea of pseudo-sample projection is exploited to develop novel tools, the pseudo-sample based contribution plots, for diagnostic purposes. The results show that, when the datasets under study are affected by severe non-linearities, the proposed approach performs better than classical ones.