2022
DOI: 10.1016/j.jallcom.2021.162319
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Tunable non-Gilbert-type damping in Ni80Fe20 films sputtered on the rippled Al2O3 substrates

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Cited by 4 publications
(11 citation statements)
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“…The periodically rippled sapphire substrates with a lateral size of 10 mm × 10 mm, mean ripple wavelengths of approximately 100 nm, 140 nm and 200 nm, and corresponding heights of approximately 16 nm, 11 nm and 25 nm were prepared by thermal annealing method [28,29]. These substrates are named as 'Ripple1', 'Ripple2' and 'Ripple3' according to the mean wavelength from small to large since that the modulation of ripple wavelength is more evident than that of height of ripple for these three substrates (see the atomic-force microscopy (AFM) images in figure 1).…”
Section: Sample Structures and Preparationmentioning
confidence: 99%
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“…The periodically rippled sapphire substrates with a lateral size of 10 mm × 10 mm, mean ripple wavelengths of approximately 100 nm, 140 nm and 200 nm, and corresponding heights of approximately 16 nm, 11 nm and 25 nm were prepared by thermal annealing method [28,29]. These substrates are named as 'Ripple1', 'Ripple2' and 'Ripple3' according to the mean wavelength from small to large since that the modulation of ripple wavelength is more evident than that of height of ripple for these three substrates (see the atomic-force microscopy (AFM) images in figure 1).…”
Section: Sample Structures and Preparationmentioning
confidence: 99%
“…In our prior work [28,29], we prepared periodically rippled Ni 80 Fe 20 (NiFe) films by depositing films on rippled sapphire substrates with different periods where the rippled sapphire substrates were obtained by thermal annealing method. These films were of varying in-plane uniaxial magnetic anisotropy (UMA) and their easy axis of anisotropy is parallel to the ripple direction.…”
Section: Introductionmentioning
confidence: 99%
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