2017
DOI: 10.1149/2.0261711jss
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Tunable SAW Devices Based on Ni:ZnO/ZnO/GaN Structures with Buried IDTs

Abstract: Tunable RF devices have promising applications in low-power resettable sensors, adaptive signal processing, and secure wireless communications. We report a tunable surface acoustic wave (SAW) device built on a multifunctional ZnO/GaN-based structure. The device consists of a piezoelectric Ni:ZnO (NZO) layer deposited on the top of a ZnO/GaN semiconductor heterostructure. The multifunctional ZnO layers are made through a hybrid deposition technique: RF sputtering of a piezoelectric NZO layer and metallorganic c… Show more

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Cited by 5 publications
(2 citation statements)
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“…For comparison, two types of channel are deposited on SiO 2 dielectric layer: (i) a layer of 40 nm Mg 0.03 Zn 0.97 O (MZO) forming a SiO 2 /MZO interface structure (regular MZO), and (ii) an identical 40 nm MZO layer with the interface modification using 5 nm MgO, comprising a SiO 2 /MgO/MZO interface structure (m-MZO). After that, a 1.6 μm thick piezoelectric NZO layer was deposited using RF sputtering (5 at% Ni in ZnO target) to form the SAW device with IDTs buried underneath the NZO piezoelectric layer to reduce energy loss and increase SAW coupling [35], as shown in figure 1(c). There are 20.5 pairs of the electrode for each IDT with a period (P) of 8 μm.…”
Section: Methodsmentioning
confidence: 99%
“…For comparison, two types of channel are deposited on SiO 2 dielectric layer: (i) a layer of 40 nm Mg 0.03 Zn 0.97 O (MZO) forming a SiO 2 /MZO interface structure (regular MZO), and (ii) an identical 40 nm MZO layer with the interface modification using 5 nm MgO, comprising a SiO 2 /MgO/MZO interface structure (m-MZO). After that, a 1.6 μm thick piezoelectric NZO layer was deposited using RF sputtering (5 at% Ni in ZnO target) to form the SAW device with IDTs buried underneath the NZO piezoelectric layer to reduce energy loss and increase SAW coupling [35], as shown in figure 1(c). There are 20.5 pairs of the electrode for each IDT with a period (P) of 8 μm.…”
Section: Methodsmentioning
confidence: 99%
“…The SAW device with a multilayer structure creates new development opportunities because of its unique combined properties such as high frequency of operation, high electromechanical coupling coefficient, improve stability, and low-temperature coefficients, which do not appear for bulk materials [22]. With multilayered structures, materials are combining with different properties in one stack can satisfy the requirements of low losses, size reduction, and high quality saw the device [23].…”
Section: Device Structurementioning
confidence: 99%