Ternary atomic layer deposition (ALD)
of tetrakisdimethylamido
tin(IV) and titanium(IV) with water was used to fabricate ultrathin
(<5 nm) Sn-doped TiO
x
(Sn:TiO
x
) coatings on a transparent, insulating, and
mesoporous ZrO2 substrate. Annealed Sn:TiO
x
coatings were fabricated to make comparisons to
annealed SnO2/TiO
x
core/shell
materials, which have applications as an anode for dye-sensitized
photoelectrosynthesis cells (DSPECs) and are also fabricated using
ALD. It has been hypothesized that the annealed SnO2/TiO
x
core/shell material possesses an interfacial
Sn1–x
Ti
x
O2 material that impacts charge transfer in functioning
DSPEC devices. The incorporation of Sn into TiO
x
by ternary ALD was corroborated by X-ray photoelectron
spectroscopy and elemental mapping by energy-dispersive spectroscopy
(EDS). The physical structure of annealed Sn:TiO
x
coatings on the ZrO2 substrate was investigated
by high-resolution transmission electron microscopy, high-angle annular
dark-field scanning transmission electron microscopy, elemental mapping
by EDS, and Raman spectroscopy. The microscopic imaging techniques
demonstrate that Sn:TiO
x
coatings are
relatively conformal and smooth. The data from Raman spectroscopy
and the microscopic imaging suggest that the annealed TiO
x
crystallizes into the tetragonal anatase polymorph,
but coatings become amorphous with the incorporation of Sn dopants.
We demonstrate that the insulating ZrO2 substrate allows
for the (spectro)electrochemical analysis of ultrathin ALD coatings
to assess the electronic structure as a function of composition. Reductive
electrochemistry of the Sn:TiO
x
coatings
reveals that both the shallow exponential and deep trap state distributions
are enhanced with increasing Sn incorporation. Spectroelectrochemistry
of Sn:TiO
x
demonstrates that two reduction
processes occur, which we argue is the reduction of Sn4+ ions to Sn2+ and electrons localizing in the TiO
x
. Using the results from the spectroelectrochemistry
of Sn:TiO
x
materials, we propose that
for annealed SnO2/TiO
x
core/shell
materials electrons localize in a shell that is best described as
a Sn:TiO
x
material. Finally, transient
absorption spectroscopy was used to investigate interfacial charge
recombination between the Sn:TiO
x
coatings
and a surface-anchored [Ru(bpy)2(4,4′-(PO3H2)2bpy)]2+ (bpy = 2,2′-bipyridine;
4,4′-(PO3H2)2bpy = 4,4′-bis(phosphonic
acid)-2,2′-bipyridine) dye. The results by transient absorption
spectroscopy suggest that charge recombination in annealed SnO2/TiO
x
and Sn:TiO
x
is rate-limited by the TiO
x
with the same mechanism of thermally activated Ti3+ →
Ti4+ hopping, despite large changes to the shallow exponential
and deep trap state distributions as a function of the composition.