1992
DOI: 10.1016/0022-3697(92)90154-6
|View full text |Cite
|
Sign up to set email alerts
|

Tunneling density of states in cuprate and bismuthate superconductors

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

4
14
0

Year Published

1993
1993
2012
2012

Publication Types

Select...
5
2

Relationship

1
6

Authors

Journals

citations
Cited by 43 publications
(18 citation statements)
references
References 9 publications
4
14
0
Order By: Relevance
“…An enhanced, symmetric dip feature in the conductance is found at approximately 3D in superconductorinsulator-superconductor (SIS) junctions [11], which can be probed with our PCT techniques [3]. This is consistent with a dip at ϳ2D, in a d-wave DOS [9] because features are shifted by an additional factor of D in the SIS configuration.…”
supporting
confidence: 61%
See 3 more Smart Citations
“…An enhanced, symmetric dip feature in the conductance is found at approximately 3D in superconductorinsulator-superconductor (SIS) junctions [11], which can be probed with our PCT techniques [3]. This is consistent with a dip at ϳ2D, in a d-wave DOS [9] because features are shifted by an additional factor of D in the SIS configuration.…”
supporting
confidence: 61%
“…There have been numerous SIN tunneling studies of Bi2212 including STM [10] and PCT [1,3] which displayed a spectral feature (dip or shoulder) at a voltage approximately twice that of the conductance peak ͑eV ϳ 2D͒. An enhanced, symmetric dip feature in the conductance is found at approximately 3D in superconductorinsulator-superconductor (SIS) junctions [11], which can be probed with our PCT techniques [3].…”
mentioning
confidence: 96%
See 2 more Smart Citations
“…1 also shows that there is not any large degree of inhomogeneity in either the break junctions or c-axis mesa junctions as they agree with a local STS spectrum in a superconducting region. It has generally been noted [15,16] that the dip voltage scaled with the maximum d-wave gap, e.g. eV dip , 3D in SIS junctions as is evident in Fig.…”
mentioning
confidence: 99%