Two- and three-dimensional near-field microscopy using scattering probes

Abstract

Scanning near-field optical microscopy (SNOM) has proven to be very powerful in terms of both resolution and efficiency. We report on new advances of this technique using metallic tips to scatter the optical field and induce dramatic field enhancements. We also present a new technique under development using multiple nanometric beads as scattering probes dispersed in the volume of the sample, rather than using a single tip. The bead positions are determined in three dimensions (3-D) with a precision better than the diffraction limit, making possible high-resolution 3-D imaging of hollow structures in relatively transparent materials.