2000
DOI: 10.3367/ufnr.0170.200003b.0247
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Two-dimensional ferroelectrics

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Cited by 90 publications
(101 citation statements)
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“…By biasing the diode by ±15 V, hysteresis is seen in the current versus voltage traces at low bias, as seen in Figure 6. Application of bias voltages up to ±15 V is more than sufficient to polarize the ferroelectric P(VDF-TrFE) [11], and/or flip the dipole direction of P(VDF-TrFE) (or both P(VDF-TrFE) and CuPc) thin films of this thickness, so this is not entirely unexpected. The dipole interaction could affect the diode properties in several ways.…”
Section: Interface Dipole Alignmentmentioning
confidence: 99%
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“…By biasing the diode by ±15 V, hysteresis is seen in the current versus voltage traces at low bias, as seen in Figure 6. Application of bias voltages up to ±15 V is more than sufficient to polarize the ferroelectric P(VDF-TrFE) [11], and/or flip the dipole direction of P(VDF-TrFE) (or both P(VDF-TrFE) and CuPc) thin films of this thickness, so this is not entirely unexpected. The dipole interaction could affect the diode properties in several ways.…”
Section: Interface Dipole Alignmentmentioning
confidence: 99%
“…The thin films thickness was dictated by a need to ensure layers free of pin-holes while still as thin as possible to diminish contributions of final state photoemission effects. Throughout, the P(VDF-TrFE) thin films were made on Al, Au and graphite substrates using the Langmuir-Blodgett (LB) technique, as described elsewhere [11,12], and are seen to be highly crystalline on graphite substrates [32][33][34].…”
Section: Methodsmentioning
confidence: 99%
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“…Ferroelectrics can also be used to create memory devices and optically controlled switches [13,16,17,18]. Many recent results are collected in the review on two dimensional ferroelectrics and thin polymer ferroelectric films represents in [19].…”
Section: Introductionmentioning
confidence: 99%
“…Using the phenomenological LandauKhalatnikov model [20,21,22,23] describing a uniaxial ferroelectric and the Maxwell equation for an electromagnetic wave, we consider the reflections and refractions of a short electromagnetic spike (i.e., a pulse without a carrier wave) through a ferroelectric thin film. We assumed that the film width is less than the spatial size of the spike, but is greater then the critical length L c below which no ferroelectricity exists [17,23,19]. According to theoretical estimations and [23,13] L c = 0.5nm for BaT iO 3 , L c = 20nm for P bT iO 3 .…”
Section: Introductionmentioning
confidence: 99%