2005
DOI: 10.1103/physrevb.72.081313
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Two-dimensional metal-insulator transition and in-plane magnetoresistance in a high-mobility strained Si quantum well

Abstract: The apparent metal-insulator transition is observed in a high quality two-dimensional electron system (2DES) in the strained Si quantum well of a Si/Si1−xGex heterostructure with mobility µ = 1.9 × 10 5 cm 2 /Vs at density n = 1.45 × 10 11 cm −2 . The critical density, at which the thermal coefficient of low T resistivity changes sign, is ∼ 0.32 × 10 11 cm −2 , so far the lowest observed in the Si 2D systems. In-plane magnetoresistance study was carried out in the higher density range where the 2DES shows the … Show more

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Cited by 46 publications
(45 citation statements)
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“…3͒. Concerning the data for Si/ SiGe quantum wells, 4 one can evaluate the slope ratio for n s = 0.515ϫ 10 11 cm −2 at about 0.45, which is consistent with our results. …”
Section: Discussionsupporting
confidence: 80%
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“…3͒. Concerning the data for Si/ SiGe quantum wells, 4 one can evaluate the slope ratio for n s = 0.515ϫ 10 11 cm −2 at about 0.45, which is consistent with our results. …”
Section: Discussionsupporting
confidence: 80%
“…21 It is worth comparing the behavior of 2D electron system in Si MOSFETs to that in another two-valley system, Si/ SiGe quantum wells. Transport properties of the latter system have been found to be very similar to those of silicon MOSFETs, 4,14,22 although the disordered potential in both cases is different resulting, particularly, from the presence/ absence of a spacer. However, the peculiarities near the onset of complete spin polarization are less pronounced in Si/ SiGe quantum wells than in MOSFETs: only a weakening, but not absence, of the temperature dependence of the resistance has been observed in the metallic regime in a partially spinpolarized state.…”
Section: Discussionmentioning
confidence: 68%
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“…Illumination turned out to be crucial to observe fractional states as it increases the quantum scattering time τ q by a factor of 5 to a value of ∼3 ps. It is thus comparable to the values observed in GaAs and Si based 2DESs [see [18], for GaAs from Refs. [19,20], and for CdTe from Ref.…”
supporting
confidence: 71%