Two-dimensional X-ray focusing by grazing incidence phase Fresnel zone plates in Kirkpatrick-Baez scheme

Schelokov, I.A.; Рощупкин, Д. В.; Кондаков, А. С.; Yakshin, Andrey; Tucoulou, R.; Brunel, M.

doi:10.1016/s0030-4018(98)00330-7

Cited by 2 publications

(1 citation statement)

References 11 publications

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“…Consequently, it is anticipated that very small x-ray focusing can be achieved without using small zones with high aspect ratios, which are used in conventional FZPs. Such focusing devices have been proposed and developed using reflecting zone plates (RZPs) 13 , an application of Bragg-Fresnel lenses 14 , and they have been used to focus x-rays generated using laboratory sources 15,16 . Furthermore, RZPs with a zone pattern consisting of eccentric ellipsoids on a flat substrate have been proposed as a point focusing device 17 .…”

Section: Introductionmentioning

confidence: 99%

New x-ray nanofocusing devices based on total-reflection zone plates

2011

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X-ray nanofocusing devices are capable of focusing X-rays down to sizes of about 10 nm. We have developed a new nanofocusing device, known as total-reflection zone plates (TRZPs), for focusing high-brilliance synchrotron radiation in the hard x-ray region. This device consists of a reflective zone pattern on a flat substrate. It has the potential to focus hard x-rays down to sub-10-nm dimensions. Furthermore, it is considerably easier to fabricate than other hard x-ray nanofocusing devices since it is used with a very small grazing incidence angle. We have focused 10-keV x-rays to sub-15 nm dimensions using a TRZP that was fabricated by conventional electron-beam lithography. In addition, we present designs for more efficient devices that have a target focus size of 5 nm. We propose and discuss a new approach for achieving point focusing with nanometer dimensions.

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Section: Introductionmentioning

confidence: 99%

New x-ray nanofocusing devices based on total-reflection zone plates

2011

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Design and optimization of a parallel spectrometer for ultra-fast X-ray science

Braig¹,

Löchel²,

Mitzner³

et al. 2014

Opt. Express

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In the present work, different varied line space (VLS) and reflection zone plate (RZP) gratings are analyzed for their suitability in low-signal femtosecond soft X-ray spectroscopy. The need for high efficiency suggests a straightened focal line whose sharpness and residual curvature will determine the quality. One- and two-dimensional VLS structures feature an attractive trade-off between a sufficient optical performance and a strongly relaxed fabrication, due to moderate line densities which are easily accessible by e-beam lithography. Based on fanned-out RZP arrays, their continuous limit version is identified to generate an almost perfect focal line however, with an aberration level three orders of magnitude better than for the VLS gratings and well below the diffraction limit over large acceptance angles.

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Two-dimensional X-ray focusing by grazing incidence phase Fresnel zone plates in Kirkpatrick-Baez scheme

Cited by 2 publications

References 11 publications

New x-ray nanofocusing devices based on total-reflection zone plates

New x-ray nanofocusing devices based on total-reflection zone plates

Design and optimization of a parallel spectrometer for ultra-fast X-ray science

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