Two directional spatial-carrier phase-shifting method for analysis of crossed and closed fringe patterns

Pirga, Maria

doi:10.1117/12.207112

Cited by 45 publications

(19 citation statements)

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“…where a(x,y) is the background; b1(x,y), b(x,y) are the contrast functions; fc, foy are the carrier frequencies introduced into x and y directions for u(x,y) and v(x,y) displacement interferograms respectively, is captured and later analyzed by two-directional spatial carrier phase-shifting method [7]. The most important interferogram parameters which influence the proper image analysis were: These image features might be changed by controlling hardware, namely the signal dynamics was changed by setting proper bias and contrast in CCD, the proper carrier frequencies were controlled by setting the injection current for laser diodes Dl and D2 [18] and the sum-type cross-pattern interferogram was obtained by controlling the polarization state of interfering pair ofbeams (A, B and C, D) [19].…”

Section: Resultsmentioning

confidence: 99%

Smart fringe image processing system

Kujawińska

Kosinski

1996

Laser Interferometry VIII: Techniques and Analysis

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Optical methods equipped with phase measuring methods of fringe pattern analysis have become recently an important tool in non-destructive testing, remote shape measurement and strain analysis. However they are usually vulnerable to improper settings of operational parameters, algorithm selection, data evaluafion sequence and often require highly qualified operator. These disadvantages may be reduced by implementing smart fringe image processing system, SFIPS, which is equipped in image quality evaluation modules and feed-back and feed-forward decision loops. The paper presents the architecture of SFIPS and the principles of formation and usage of image feature vectors at sequential stages of processing. Example of implementing the SFIPS for analysis of crossed fringe pattern obtained in grating interferometry system is given.Key words: smart fringe pattern processing system, automatic fringe pattern analysis, image feature vector, phase measuring methods, image quality evaluation.-Designer's Level SFIPS [13], which goal is to produce an extended image feature vectors, set model operational parameters to real or dummy hardware, choose the best method and algorithm for fringe pattern(s) analysis and define the output image feature vector.-User's Level SFIPS, which goal is to control the measurement and processing procedure, performed at a known type of object, by chosen optical method, at given optomechanical and electro-optic environment and according to the predefined at the Designer's Level method and data evaluation steps. The output image feature vector is here used to control automatically the process.The system presented uses various techniques such as distributed (multi point) quantity and quality estimation of image features during measurement and analysis process, feed-back and feed-forward loops which can grant fully automatic measurement and analysis process. 14 / SPIE Vol. 2860 0-8194-2248-71961$6.OO Downloaded From: http://proceedings.spiedigitallibrary.org/ on 06/16/2016 Terms of Use: http://spiedigitallibrary.org/ss/TermsOfUse.aspx second system are limited to the specific class of objects, hardware, algorithm and the measurement sequence. Therefore in the following sections the description of Designer's LeveLSFIPS is given, while the User's Level SFIPS is demonstrated in the experimental part of the paper. SPIE Vol. 2860 / 15 Downloaded From: http://proceedings.spiedigitallibrary.org/ on 06/16/2016 Terms of Use: http://spiedigitallibrary.org/ss/TermsOfUse.aspx

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Section: Resultsmentioning

confidence: 99%

Smart fringe image processing system

Kujawińska

Kosinski

1996

Laser Interferometry VIII: Techniques and Analysis

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“…Another algorithm that fulfills all necessary requirements (small working window, the phase shift treated as constant between samples but of unknown value) is the five-point algorithm developed by Pirga [17] and Larkin [18] independently. After the necessary modification analogous to the one presented in Eq.…”

Section: Directional Spatial Carrier Phase Shifting Methodsmentioning

confidence: 99%

Vibration amplitude recovery from time averaged interferograms using the directional spatial carrier phase shifting method

Styk¹,

Brzeziński²

2011

SPIE Proceedings

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The authors of the paper propose a novel approach to the analysis of fringe patterns described by the Bessel function. This kind of patterns can be met while using Time Averaging Interferometry for vibration investigations. The directional spatial carrier phase shifting technique (one of the automatic fringe pattern analysis methods) is proposed to decode the information encoded in the function argument. With additional correction process (the analyzed J 0 function differs from the sinusoidal one) the investigated object vibration amplitude may be evaluated. An unquestionable merit of the proposed technique is its processing simplicity and single pattern analysis scheme. The paper presents features of the proposed approach as well as its possible measurement errors, via extensive numerical simulations. Performed experiments corroborate the theoretical findings.

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“…The differences between two waves that interfere are automatically evaluated using the Fourier transform method [1,4,11] and the wavefront coefficients can be sent to the deformable mirror. We also tried to use spatial carrier phase shifting method for phase evaluation [4,12]. Figure 6 and 7 present interferograms from the experimental setup for the surface before and after adaptive wavefront compensation for measurements of flat and spherical surfaces.…”

Section: Experimental Setup Of Two-beam Interferometer With Adaptive mentioning

confidence: 99%

Analysis of interferometer with adaptive reference wave

Novák¹,

Novák²,

Mikš³

2013

AIP Conference Proceedings

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Adaptive interferometer based on wave mixing in a photorefractive crystal under alternating electric field Abstract. Our work performs both theoretical and experimental analysis of an interferometric system, which adapts a shape of a reference wavefront to a shape of a measured optical surface using an adaptive optical element. The interferometric system uses a deformable mirror for a wavefront compensation corresponding to the test surface. The accuracy and range of compensation is given by a type of the deformable mirror. It is analyzed a possibility of the application for testing optical surfaces.

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Two directional spatial-carrier phase-shifting method for analysis of crossed and closed fringe patterns

Cited by 45 publications

References 0 publications

Smart fringe image processing system

Smart fringe image processing system

Vibration amplitude recovery from time averaged interferograms using the directional spatial carrier phase shifting method

Analysis of interferometer with adaptive reference wave

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