“…Furthermore, the decrease in image numbers simplifies the measurement process, but the phase jumping and discontinuities in the conventional spatial phase unwrapping reduce the stability when measuring complicated specular surfaces or discontinuous surfaces [ 18 , 23 , 24 , 25 , 26 ]. In the field of dynamic 3D shape measurement, two-frequency fringe projection profilometry employs an additional group of phase-shifting patterns with lower frequency to assistant pixel-by-pixel phase unwrapping, avoiding the phase ambiguities introduced by sinusoidal patterns and the arctangent function [ 18 , 24 ]. Research showed that another frequency pattern can assist phase unwrapping and lower the influence of phase ambiguity [ 18 , 24 , 25 , 26 ].…”