2023 IEEE International Conference on Networking, Sensing and Control (ICNSC) 2023
DOI: 10.1109/icnsc58704.2023.10319035
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Two-stage Stochastic Program for Capacitated Disassembly Lot-sizing Under Random Yield

Oumayma Laouini,
Ilhem Slama,
Faicel Hnaien
et al.
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Cited by 2 publications
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