Über die Einführung der Azidgruppe in Komplexsalze

Strecker, W.; Schwinn, Ernst

doi:10.1002/prac.19391520703

Cited by 21 publications

(11 citation statements)

References 10 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…Two pieces with nitrided surfaces were glued together face to face. This material sandwich was then prepared according to the method described by Strecker et al [15] to produce electron transparent TEM specimens in cross-section. Metallographic studies (light microscopy and scanning electron microscopy (SEM)) were performed on pieces whichinstead of dimpling and ion beam thinning -were just polished and subsequently etched with a solution of 2 % HNO 3 and 0.15 % HCl in ethanol.…”

Section: Methodsmentioning

confidence: 99%

Growth and Microstructure of Iron Nitride Layers and Pore Formation in ϵ-Fe₃N

Middendorf¹,

Mader²

2003

MEKU

View full text Add to dashboard Cite

Section: Methodsmentioning

confidence: 99%

Growth and Microstructure of Iron Nitride Layers and Pore Formation in ϵ-Fe₃N

Middendorf¹,

Mader²

2003

MEKU

View full text Add to dashboard Cite

“…Additionally, the powders as well as the fibers were embedded together with epoxy glue in alumina holders and were thinned to electron transparency by ion beam etching. 11 The fibers were prepared in cross section using a specially developed method in which a bundle of fibers is held in a notched two-piece holder. 12 Since the electrical conductivity of the ceramics is sufficiently high, coating with a conducting layer was not necessary.…”

Section: B Characterization Methodsmentioning

confidence: 99%

Structural characterization of amorphous ceramics in the system Si–B–N–(C) by means of transmission electron microscopy methods

et al. 1999

View full text Add to dashboard Cite

Amorphous ceramics with the chemical composition Si 3 B 3 N 7 and SiBN 3 C were produced from single-source molecular precursors by polymerization and pyrolysis. The powder and fiber materials were investigated by means of energy filtering transmission electron microscopy. The intensity of elastically scattered electrons is recorded to calculate the pair distribution function of these ceramics. In the pair distribution function of Si 3 B 3 N 7 three significant maxima at 0.144, 0.172, and 0.291 nm are clearly resolved and are assigned to the pair distances B-N, Si-N, and Si-Si (N-N), respectively, by comparison to crystalline materials. The predominant structural units of the ceramic are trigonal planar BN 3 and tetrahedral SiN 4 groups, which are close to their regular symmetry. The overall pair distribution function of SiBN 3 C is very similar to that of Si 3 B 3 N 7 ; however, the maxima are broadened due to the incorporation of carbon into the network. High-resolution mapping of the elements Si, B, N, and C with electron spectroscopic imaging reveals a homogeneous distribution on a subnanometer scale without precipitation or separation of, for example, carbon-rich clusters. Similarly, elemental mapping of Si 3 B 3 N 7 reveals a random distribution of the elements Si, B, and N at the same scale. Both new ceramics consist of an amorphous network with bonds and coordinations as preformed in the precursor.

show abstract

“…For the TEM studies, samples were prepared in cross section 27 : two substrates were glued together with their film surfaces. For the TEM studies, samples were prepared in cross section 27 : two substrates were glued together with their film surfaces.…”

Section: B Characterization Of Filmsmentioning

confidence: 99%

Textured ZnO Thin Films on (0001) Sapphire Produced by Chemical Solution Deposition

2002

View full text Add to dashboard Cite

Highly textured zinc oxide films were produced on basal plane sapphire substrates by chemical solution deposition. Films with oriented growth were achieved by spin coating a 0.75 M precursor solution of zinc acetate dihydrate and ethanolamine in 2-methoxyethanol, heated at 300°C/10 min, then at 500°C/5 h, and finally at 850°C/12 h. Films were characterized with x-ray diffraction (XRD) and scanning and transmission electron microscopy. The films exhibited only the (0002) ZnO line in XRD diagrams, proving a very well-developed out-of-plane texture. At temperatures above 700°C the ZnAl 2 O 4 spinel was observed, which formed as a reaction layer between sapphire and ZnO. Few specimens produced both in-plane and out-of-plane oriented growth of ZnO on basal plane sapphire. It was hypothesized that the substrate miscut, uncontrolled for the current experiments, could be the cause of the infrequent growth of epitaxial films.

show abstract

Über die Einführung der Azidgruppe in Komplexsalze

Cited by 21 publications

References 10 publications

Growth and Microstructure of Iron Nitride Layers and Pore Formation in ϵ-Fe₃N

Growth and Microstructure of Iron Nitride Layers and Pore Formation in ϵ-Fe₃N

Structural characterization of amorphous ceramics in the system Si–B–N–(C) by means of transmission electron microscopy methods

Textured ZnO Thin Films on (0001) Sapphire Produced by Chemical Solution Deposition

Contact Info

Product

Resources

About

Über die Einführung der Azidgruppe in Komplexsalze

Cited by 21 publications

References 10 publications

Growth and Microstructure of Iron Nitride Layers and Pore Formation in ϵ-Fe3N

Growth and Microstructure of Iron Nitride Layers and Pore Formation in ϵ-Fe3N

Structural characterization of amorphous ceramics in the system Si–B–N–(C) by means of transmission electron microscopy methods

Textured ZnO Thin Films on (0001) Sapphire Produced by Chemical Solution Deposition

Contact Info

Product

Resources

About

Growth and Microstructure of Iron Nitride Layers and Pore Formation in ϵ-Fe₃N

Growth and Microstructure of Iron Nitride Layers and Pore Formation in ϵ-Fe₃N