Ultra broadband phase measurements on nanostructured metasurfaces

Pshenay-Severin, Ekaterina; Falkner, Matthias; Helgert, Christian; Pertsch, Thomas

doi:10.1063/1.4881332

Cited by 16 publications

(12 citation statements)

References 21 publications

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“…Note that here, the interference is performed in the real-space domain 52 , 53 . It can also be applied to the frequency domain to realise white-light interferometry, which has been used to extract the effective refractive index of metamaterials 46 , 47 .…”

Section: Resultsmentioning

confidence: 99%

“…Although the designed phase distribution can be optimised perfectly in theory, the actual regulated phase distribution of fabricated metalenses will be limited by the materials and manufacturing processes 46 , 47 . The deviation of the actual phase distribution from the ideal phase distribution will be reflected in the functional performance of the optical metalens device.…”

Section: Introductionmentioning

confidence: 99%

“…The deviation of the actual phase distribution from the ideal phase distribution will be reflected in the functional performance of the optical metalens device. Measuring the actual controlled phase distribution 46 , 47 is of great significance to the connection between the design and manufacturing processes of metalenses. However, there has been no direct method to characterise the performance of a metalens through its actual phase distribution.…”

Section: Introductionmentioning

confidence: 99%

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Phase characterisation of metalenses

et al. 2021

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Metalenses have emerged as a new optical element or system in recent years, showing superior performance and abundant applications. However, the phase distribution of a metalens has not been measured directly up to now, hindering further quantitative evaluation of its performance. We have developed an interferometric imaging phase measurement system to measure the phase distribution of a metalens by taking only one photo of the interference pattern. Based on the measured phase distribution, we analyse the negative chromatic aberration effect of monochromatic metalenses and propose a feature size of metalenses. Different sensitivities of the phase response to wavelength between the Pancharatnam-Berry phase-based metalens and propagation phase-reliant metalens are directly observed in the experiment. Furthermore, through phase distribution analysis, it is found that the distance between the measured metalens and the brightest spot of focusing will deviate from the focal length when the metalens has a low nominal numerical aperture, even though the metalens is ideal without any fabrication error. We also use the measured phase distribution to quantitatively characterise the imaging performance of the metalens. Our phase measurement system will help not only designers optimise the designs of metalenses but also fabricants distinguish defects to improve the fabrication process, which will pave the way for metalenses in industrial applications.

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Section: Resultsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Phase characterisation of metalenses

et al. 2021

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“…Hilbert transforms have been used frequently for phase retrieval in interferometry as a substitute to FTSI where the Hilbert transform is applied to the interferogram rather than transmission spectrum of a sample [19,20]. While Hilbert transforms for phase retrieval have been applied to metasurfaces before, the method has not been applied to the meta-atom design step, nor the nonlinear optical regime [21].…”

Section: The Hilbert Transform Methodsmentioning

confidence: 99%

A Hilbert transform method for measuring linear and nonlinear phase shifts imparted by metasurfaces

Wynne

Ballantyne

et al. 2020

Photonics and Nanostructures - Fundamentals and Applications

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Nonlinear metasurfaces that dynamically manipulate the phase of a passing light beam are of interest for a wide range of applications. The controlled operation of such devices requires accurate measurements of the optical transmission phase in both the linear and nonlinear regime, an experimentally challenging task. In this paper we show that this phase information can be extracted directly from simple transmission measurements, using a Hilbert transform approach, removing the need for complicated, interferometric experimental set-ups, and enabling direct measurements of the phase in conditions not suitable for other traditional approaches, such Z-scan measurements.

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“…Pshenay‐Severin et al present a white light walkoff (Jamin–Lebedeff) interferometer. After recombination of the sample and reference beams, the resulting interference spectrum is analyzed.…”

Section: Introductionmentioning

confidence: 99%

Characterization of Dynamic and Nanoscale Materials and Metamaterials with Continuously Referenced Interferometry

Ollanik

Hartfield

et al. 2019

Advanced Optical Materials

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The development of new optical materials and metamaterials has seen a natural progression toward both nanoscale geometries and dynamic performance. The development of these materials, such as optical metasurfaces which impart discrete, spatially dependent phase shifts on incident light, often benefits from the measurement of transmitted or reflected phase. Careful measurement of phase typically proves difficult to implement, due to high measurement sensitivity to practically unavoidable environmental sources of noise and drift. To date, no characterization technique has yet emerged as a frontrunner for these applications. This challenge is addressed using a custom‐designed three‐beam Mach–Zehnder interferometer capable of continuously referenced measurement of both phase and transmittance, resulting in a 10× reduction of noise and drift and phase measurement standard deviation over 10 min of 0.56° and over 16 h of 2.8°. High measurement stability provided by this method enables samples to be easily characterized under dynamic conditions. Temperature‐dependent measurements are demonstrated with phase‐change material vanadium dioxide (VO2), and with wavelength‐dependent measurements of a dielectric Huygens metasurface supporting a characteristic resonant reflection peak. A Fourier‐based signal filtering technique is applied, reducing measurement uncertainty to 0.13° and enabling discernment of monolayer thickness variations in 2D material MoS2.

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Ultra broadband phase measurements on nanostructured metasurfaces

Cited by 16 publications

References 21 publications

Phase characterisation of metalenses

Phase characterisation of metalenses

A Hilbert transform method for measuring linear and nonlinear phase shifts imparted by metasurfaces

Characterization of Dynamic and Nanoscale Materials and Metamaterials with Continuously Referenced Interferometry

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