2012 24th International Symposium on Power Semiconductor Devices and ICs 2012
DOI: 10.1109/ispsd.2012.6229028
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Ultra compact and high reliable SiC MOSFET power module with 200°C operating capability

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Cited by 32 publications
(11 citation statements)
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“…This means that in order to achieve high current ratings, several chips have to be connected in parallel, either as separate components or in a multi-chip module. Several attempts to achieve this have already been presented [1], [2]. However, many details regarding these issues are still uncertain, especially issues regarding transient mismatches.…”
Section: Introductionmentioning
confidence: 99%
“…This means that in order to achieve high current ratings, several chips have to be connected in parallel, either as separate components or in a multi-chip module. Several attempts to achieve this have already been presented [1], [2]. However, many details regarding these issues are still uncertain, especially issues regarding transient mismatches.…”
Section: Introductionmentioning
confidence: 99%
“…Although this is a low power module using Si devices, the benefits directly transfer to modules in the higher power range-especially since the voltage and current slew rates encountered will be more severe as the power levels rise. In 2011, Fuji Electric [56] proposed the use of copper pins to connect to the device bond pads instead of wire bonds (Figure 12). The copper pins fit into the through-hole connections on the power circuit board.…”
Section: D Integration Effortsmentioning
confidence: 99%
“…A fin heat sink was used for heat removal. In 2011, Fuji Electric [56] proposed the use of copper pins to connect to the device bond pads instead of wire bonds (Figure 12). The copper pins fit into the through-hole connections on the power circuit board.…”
Section: D Integration Effortsmentioning
confidence: 99%
“…On the other hand these solutions are not always compatible with current PE system solutions, they are not supported by existing production lines and their reliability, power scaling capability and operating temperature capability are often not clear. An interesting high-power density module concept based on replacement of bond-wire interconnections by power board was presented by Horio et al [8]. A high-performance halfbridge module assembled by conventional packaging technologies was presented in [9], where the authors have optimized the module performance by placing semiconductor devices in parallel lines (strip line concept).…”
Section: Introductionmentioning
confidence: 99%