Ultra-compact on-chip slot Bragg grating structure for small electric field detection

Qiu, Wentao; Lu, Huihui; Baida, Fadi; Bernal, Maria–Pilar

doi:10.1364/prj.5.000212

Cited by 32 publications

(12 citation statements)

References 23 publications

(28 reference statements)

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“…Meanwhile, it is possible to realize low-threshold broadband OFCs in slot waveguides owing to the enhancement of light-matter interaction. So far different types of slot waveguides have been realized and implemented in many areas, including small electric field detection [30], second-harmonic generation [31] and supercontinuum generation [32]. Fig.…”

Section: Device Design and Ofc Generationmentioning

confidence: 99%

Low-Threshold 4/5 Octave-Spanning Mid-Infrared Frequency Comb in a LiNbO$_3$ Microresonator

et al. 2019

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Mid-infrared (MIR) optical frequency combs (OFCs) are ideal light sources for precision metrology and can find extensive applications, especially in molecular spectroscopy and gas detection. Here the generation of mode-locked MIR frequency comb in a LiNbO 3 microring through optimized slot-waveguide design is proposed. Such microcomb can span over four-fifths of an octave (ranging from ∼2810 nm to ∼4630 nm) with pump power as low as 50 mW, which can be applied to the 2f-3f self-referencing for fully stabilization and helpful to monolithic integration of the whole system. Further investigations on complex dynamical processes for the microcomb generation suggest that the intracavity soliton drifting caused by the third-order dispersion could be compensated by the self-steepening effect as introducing an additional drift through proper dispersion tailoring. This work could facilitate the low-threshold broadband MIR frequency comb generation technique, as well as provide a way to realize more delicate control of soliton microcombs in both temporal and spectral domain.

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Section: Device Design and Ofc Generationmentioning

confidence: 99%

Low-Threshold 4/5 Octave-Spanning Mid-Infrared Frequency Comb in a LiNbO$_3$ Microresonator

et al. 2019

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“…Near-field measurement [1,2] is a popular method for electromagnetic analysis of the electronic circuit. Probe calibration [3,4] is significant for near field measurement [5,6].…”

Section: Introductionmentioning

confidence: 99%

“…where d is the thickness of the medium in the microstrip line, I is the current on the trace of the microstrip line and h is the height between the loop centre and the surface of the microstrip line. Obviously, (1) is the solution to the ideal case of the static magnetic field without considering the reflection and loss on the microstrip line. The calibration factor (CF) of the probe in logarithmic form can be calculated by using the S -parameter [22,23] that is, CF = 20 log 10…”

Section: Introductionmentioning

confidence: 99%

Differential magnetic field probe calibration based on symmetric de‐embedding technology

Hou,

Xue,

Ding

et al. 2023

IET Science Measure & Tech

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The de‐embedding calibration method has been proposed to achieve high‐precision calibration for a single port electric field or magnetic field probe, which can effectively eliminate the calibration ripple. However, the method's effectiveness for a four‐port calibration system has not been verified yet. In this paper, a four‐port de‐embedding calibration method with a differential magnetic field probe is proposed, and its effectiveness is proved. Two symmetric grounded coplanar waveguide transmission lines are applied in the proposed method to solve the ABCD‐matrix of the embedded part of the calibrator. The de‐embedded S‐parameter model of the four‐port calibration system for differential magnetic field probe can be obtained. The calibration results indicate that the proposed method can also reduce the calibration ripple and compensate for the attenuation caused by the calibrator. Compared with the traditional calibration method using a microstrip line calibrator, the ripples of the proposed method can be reduced by 34%. The analysis results of the frequency interval of the ripple (FIR) in different methods show that the de‐embedding method can reduce the FIRs (except around 1.2 GHz) caused by the reflection of the calibrator and retain the FIR (about 1.2 GHz) caused by the reflection of the probe itself.

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“…Near‐field measurement 1–8 are widely applied to electromagnetic (EM) interference analysis, 9–11 reconstruction of equivalent emission sources, 12,13 faults location, 13,14 shielding analysis, 15 radio frequency (RF) current and voltage measurement, 16,17 and so forth. The near‐field probe is a key tool for near‐field measurement, so the design and characterization of the probe are essential for the above applications 1–3,18–28 …”

Section: Introductionmentioning

confidence: 99%

De‐embedding calibration for an electromagnetic dual probe using GCPW

Li,

Shao,

Tian

et al. 2023

Micro & Optical Tech Letters

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An ultrawideband de‐embedding calibration method (DCM) for a dual probe is proposed in this paper. Different from the conventional calibration method (CCM), in which a microstrip calibrator and the dual probe form a three‐port calibration network, the proposed calibration system is a four‐port network. By using two different lengths of grounded coplanar waveguide (GCPW) calibrators, namely line‐kit and through‐kit, the de‐embedded ‐parameter model of the calibration network is obtained. Measured results show that the ripple of the DCM with GCPW reduced by 59% of the CCM with the microstrip calibrator, and the phase delay has been almost compensated. In addition, the proposed method reduces the attenuation by approximately 0.7 dB at 10 GHz and 1.15 dB at 20 GHz. The calibration results indicate that the working frequency of the DCM is up to 22 GHz.

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Ultra-compact on-chip slot Bragg grating structure for small electric field detection

Cited by 32 publications

References 23 publications

Low-Threshold 4/5 Octave-Spanning Mid-Infrared Frequency Comb in a LiNbO$_3$ Microresonator

Low-Threshold 4/5 Octave-Spanning Mid-Infrared Frequency Comb in a LiNbO$_3$ Microresonator

Differential magnetic field probe calibration based on symmetric de‐embedding technology

De‐embedding calibration for an electromagnetic dual probe using GCPW

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