2013 IEEE International Ultrasonics Symposium (IUS) 2013
DOI: 10.1109/ultsym.2013.0490
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Ultra-high Q.f product laterally-coupled AlN/silicon and AlN/sapphire High Overtone Bulk Acoustic wave Resonators

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Cited by 7 publications
(4 citation statements)
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“…In a previous work [5], a temperature-stable HBAR have been showed based on the combination of a Lithium of Niobate piezoelectric layer and a Quartz substrate, with Q factors in excess of 10,000 above 1 GHz . In an other previous work [6], a high frequency and high quality HBAR based on AlN piezoelectric film sputtered on Sapphire substrate have been showed, reached Q.f values of 6.44×10 13 Hz. The new HBAR device stack, based on a thinned LiNbO 3 piezoelectric layer transferred on a LiTaO 3 substrate combine better characteristic of the both previous resonator.…”
Section: Discussionmentioning
confidence: 75%
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“…In a previous work [5], a temperature-stable HBAR have been showed based on the combination of a Lithium of Niobate piezoelectric layer and a Quartz substrate, with Q factors in excess of 10,000 above 1 GHz . In an other previous work [6], a high frequency and high quality HBAR based on AlN piezoelectric film sputtered on Sapphire substrate have been showed, reached Q.f values of 6.44×10 13 Hz. The new HBAR device stack, based on a thinned LiNbO 3 piezoelectric layer transferred on a LiTaO 3 substrate combine better characteristic of the both previous resonator.…”
Section: Discussionmentioning
confidence: 75%
“…In [6] we fabricated HBARs on Silicon and Sapphire substrates which reached Q.f values of respectively 7.2×10 12 and 6.44×10 13 Hz. Although the quality factors obtained with Sapphire substrates are impressive, this substrate led to a temperature dependence of close to -35 ppm/K.…”
Section: A Hbar Qf Productmentioning
confidence: 99%
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