Ultra low-noise current sources

Ciofi, C.; Giannetti, R.; Dattilo, V.; Neri, Bruno

doi:10.1109/19.728794

Cited by 29 publications

(18 citation statements)

References 6 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The result implies that the designed current source achieves the performance required for the noise measurements of 0.1 nT Hz −1/2 at 0.1 mHz, i.e., to be on the safe side, stability of the applied magnetic field must be at least one order of magnitude less noisy than the limit imposed by the magnetometer requirement or the expected noise of the magnetometer under study. The main source of technical noise in the whole bandwidth is the voltage reference, hence, making use of low-noise voltage references [31] or batteries [32] will help to improve the noise performance significantly. By eliminating this technical noise, the equivalent magnetic field noise would be reduced to around 6.3 nA Hz −1/2 (2.5 pT Hz −1/2 ) at 0.1 mHz without any thermal insulator or active temperature controller.…”

Section: Equivalent Magnetic Field Noise Due To the Leadingfield Currmentioning

confidence: 99%

Noise characterization of an atomic magnetometer at sub-millihertz frequencies

Mateos

Patton

Zhivun

et al. 2015

Sensors and Actuators A: Physical

View full text Add to dashboard Cite

Noise measurements have been carried out in the LISA bandwidth (0.1 mHz to 100 mHz) to characterize an alloptical atomic magnetometer based on nonlinear magneto-optical rotation. This was done in order to assess if the technology can be used for space missions with demanding low-frequency requirements like the LISA concept. Magnetometry for low-frequency applications is usually limited by 1/ f noise and thermal drifts, which become the dominant contributions at sub-millihertz frequencies. Magnetic field measurements with atomic magnetometers are not immune to low-frequency fluctuations and significant excess noise may arise due to external elements, such as temperature fluctuations or intrinsic noise in the electronics. In addition, low-frequency drifts in the applied magnetic field have been identified in order to distinguish their noise contribution from that of the sensor. We have found the technology suitable for LISA in terms of sensitivity, although further work must be done to characterize the low-frequency noise in a miniaturized setup suitable for space missions.

show abstract

Section: Equivalent Magnetic Field Noise Due To the Leadingfield Currmentioning

confidence: 99%

Noise characterization of an atomic magnetometer at sub-millihertz frequencies

Mateos

Patton

Zhivun

et al. 2015

Sensors and Actuators A: Physical

View full text Add to dashboard Cite

show abstract

“…The current source, based on the Ref. [17] circuit design, employed a mercury battery as a voltage reference and was contained in a thermally isolated enclosure.…”

Section: H Magnetic Field Generation and Controlmentioning

confidence: 99%

Techniques used to search for a permanent electric dipole moment of the199Hg atom and the implications forCPviolation

et al. 2013

View full text Add to dashboard Cite

Copyright and reuse:Sussex Research Online is a digital repository of the research output of the University.Copyright and all moral rights to the version of the paper presented here belong to the individual author(s) and/or other copyright owners. To the extent reasonable and practicable, the material made available in SRO has been checked for eligibility before being made available.Copies of full text items generally can be reproduced, displayed or performed and given to third parties in any format or medium for personal research or study, educational, or not-for-profit purposes without prior permission or charge, provided that the authors, title and full bibliographic details are credited, a hyperlink and/or URL is given for the original metadata page and the content is not changed in any way. We discuss in detail the search for a permanent electric dipole moment (EDM) of the 199 Hg atom reported by Griffith et al. [Phys. Rev. Lett. 102, 101601 (2009)]. The upper bound, d( 199 Hg) < 3.1 × 10 −29 e cm (95% C.L.), is a factor of 7 improvement over the best previous EDM limit for 199 Hg, provides the most sensitive probe to date for EDMs in diamagnetic atoms, and sets new limits on time-reversal symmetry violation in extensions to the standard model. This paper provides extensive discussion of the techniques used to search for the 199 Hg EDM and the implications of the new 199 Hg EDM limit for CP violation in elementary particle interactions.

show abstract

“…14, because, as in the case of the voltage sources, we must avoid too large values of V DS independently of the particular value of the load impedance Z L . The circuit we normally use is described in detail in reference [33]. In such a circuit, two IF3601 JFET are used in parallel in order to achieve a maximum current output of about 100 mA without causing excessive heating of the transistors.…”

Section: Fixed Value Low Noise Voltage and Current Sourcesmentioning

confidence: 99%

Low-frequency noise measurements: applications, methodologies and instrumentation

Ciofi

Neri²

2003

SPIE Proceedings

View full text Add to dashboard Cite

The analysis of the low frequency noise generated in solid state devices represents a key factor in the era of VLSI technology. This analysis is mandatory in order to obtain a characterization of the source of disturbances which cause a degradation of the signal to noise ratio. In fact, the increasing miniaturization level of modern integrated circuits leads to a significant increase in the noise to signal ratio, thus making noise one of the main limiting factors for pursuing the ultimate miniaturization limits. Moreover, as low frequency noise can be used as a probe capable of investigating the phenomena occurring at a microscopic scale, it can be useful for characterizing the quality and the reliability of microelectronic materials and devices. In the first part of this paper, as an example of possible applications, an overview of the utilization of Low Frequency Noise Measurement (LFNM) technique to the study of the most frequent causes of failure in integrated circuits and discrete components is presented and the need for purposely designed instrumentation for this type of study will be put in evidence. Starting from the examples presented in the first part, in the second part an overview of the instrumentation and procedures required to obtain a minimization of the background noise of the entire measurement system is presented. In fact, especially in the case of low frequency noise measurements (f< 1 Hz), the lack of standard, commercially available instrumentation characterized by the required sensitivity, may be one of the main obstacles to the utilization of LFNM technique. For this reason, a review of the most relevant results obtained by our research groups during the last few years in the design of dedicated ultra-low noise instrumentation and in the tuning up of the methodologies for the analysis of noise data, is presented.

show abstract

Ultra low-noise current sources

Cited by 29 publications

References 6 publications

Noise characterization of an atomic magnetometer at sub-millihertz frequencies

Noise characterization of an atomic magnetometer at sub-millihertz frequencies

Techniques used to search for a permanent electric dipole moment of the199Hg atom and the implications forCPviolation

Low-frequency noise measurements: applications, methodologies and instrumentation

Contact Info

Product

Resources

About