2005
DOI: 10.1016/j.nimb.2005.05.040
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Ultra-shallow junction (USJ) sheet resistance measurements with a non-penetrating four point probe

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Cited by 11 publications
(6 citation statements)
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“…Next, let us consider the zero-penetration/non-contact techniques: (i) the elastic metal four point probe (EMP) from Solid State Measurements [7], (ii) the micro four point probe (M4PP) tool from CAPRES [8] and (iii) the sheet resistance and leakage (RsL) tool from Frontier Semiconductor [9]. EMP is a four point probe tool based on the usage of relatively large metal probes (load=25 g, contact size=30-50 µm, separation=1.8 mm), which make only an elastic contact with the sample/wafer, i.e.…”
Section: Sheet Resistancementioning
confidence: 99%
“…Next, let us consider the zero-penetration/non-contact techniques: (i) the elastic metal four point probe (EMP) from Solid State Measurements [7], (ii) the micro four point probe (M4PP) tool from CAPRES [8] and (iii) the sheet resistance and leakage (RsL) tool from Frontier Semiconductor [9]. EMP is a four point probe tool based on the usage of relatively large metal probes (load=25 g, contact size=30-50 µm, separation=1.8 mm), which make only an elastic contact with the sample/wafer, i.e.…”
Section: Sheet Resistancementioning
confidence: 99%
“…The spring tip configuration (STC) consisted of four spring tip electrodes (spring probes; P19‐2221, Harwin, Portsmouth, UK; Fig. 3, right) 29–31. In this case, circular membranes with a diameter of 25 mm were used.…”
Section: Methodsmentioning
confidence: 99%
“…The proton conductivity for the STC [σ(STC)] and the PWC [σ(PWC)] was calculated as follows30, 33: where 𝓁 is the membrane thickness; | Z | −2°<φ<2° is the average impedance; correction factors f 1 and f 2 are the finite thickness and the finite width correction, respectively; W is the width of the membrane sample; and s is the distance between the inner electrodes. The conductivity determined with the STC is dependent on 𝓁 and | Z | −2°<φ<2° .…”
Section: Methodsmentioning
confidence: 99%
“…Probe penetration and junction leakage current are serious problems for ultra-shallow junctions, where it can lead to erroneous results. Modified contact techniques are the zero-penetration elastic metal four-point probe (EMP) 6 and the micro four point probe (M4PP). 7 EMP is a four-point probe with relatively large metal probes that make only elastic contacts leaving no imprints.…”
Section: Some Techniquesmentioning
confidence: 99%