2019
DOI: 10.1016/j.hedp.2019.05.002
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Ultrafast anisotropic disordering in graphite driven by intense hard X-ray pulses

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Cited by 15 publications
(10 citation statements)
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“…Shortly after that, thermal melting of the new phase starts. However, at modern X-ray free-electron laser facilities, equipped for femtosecond time-resolved diffraction experimental capabilities, one should be able to observe the nonthermal transitions 61 . Thus, we suggest that X-ray-pump X-ray-probe experiments, homogeneously heating nanoclusters and probing their structure at sub-picosecond scales, should be able to experimentally validate our predictions 62 .…”
Section: Discussionmentioning
confidence: 99%
“…Shortly after that, thermal melting of the new phase starts. However, at modern X-ray free-electron laser facilities, equipped for femtosecond time-resolved diffraction experimental capabilities, one should be able to observe the nonthermal transitions 61 . Thus, we suggest that X-ray-pump X-ray-probe experiments, homogeneously heating nanoclusters and probing their structure at sub-picosecond scales, should be able to experimentally validate our predictions 62 .…”
Section: Discussionmentioning
confidence: 99%
“…In particular, the way that NLTE dynamics simulations are fed by LTE IPD input such as EK and SP might be questionable for calculation of XFEL-created dense plasmas. Furthermore, nonthermal femtosecond phase transitions induced by an intense hard-x-ray pulse have been reported [51,52], thus necessitating an IPD treatment that is unrestricted, for both electrons and ions, by any thermal equilibrium condition.…”
Section: Introductionmentioning
confidence: 99%
“…To date, X-ray measurements of ultrafast melting or disordering have largely relied on changes in diffraction peaks, as in previous work at SACLA [9,10] and elsewhere [11]. The latter, by Pardini et al, demonstrates the challenges of studying phase transitions by observing weakening of diffraction lines, particularly when both the pump and probe pulse are at the same energy; what was initially believed to be strong diffraction signal from silicon 333 up to 150 fs after X-ray heating was in fact due to fluctuations in the pulse fluences and a loss of beam overlap [11,12].…”
mentioning
confidence: 99%