Abstract:We perform fs degenerate pump-probe experiments on an InGaN/GaN quantum-well sample and an InGaN thin film of 800 nm in thickness, in which nm-scale cluster structures have been identified. In the InGaN/GaN quantum-well sample, we can identify three stages of carrier relaxation. The fast-decay time, ranging from several hundred fs to one ps, corresponds to the process reaching a local quasi-equilibrium condition, in which carriers reach a thermal distribution within one or a few nearby indium-rich clusters. Th… Show more
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