2001
DOI: 10.1063/1.1394953
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Ultrafast carrier trapping in microcrystalline silicon observed in optical pump–terahertz probe measurements

Abstract: We report on direct evidence of ultrafast carrier dynamics displaying features on the picosecond time scale in microcrystalline silicon (c-Si:H). The dynamics of photogenerated carriers is studied by using above-band-gap optical excitation and probing the instantaneous carrier mobility and density with a THz pulse. Within the first picoseconds after excitation, the THz transmission transients show a fast initial decay of the photoinduced absorption followed by a slower decrease due to carrier recombination. We… Show more

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Cited by 103 publications
(99 citation statements)
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“…From the observed dynamics, trapping processes occurring on picosecond time scales can be identified (Jepsen et al, 2001;Messner et al, 2001). Especially in materials that possess a low degree of crystallinity or porous materials, the conduction pathway can be significantly obstructed, resulting in the localization of charge carriers.…”
Section: Ultrafast Dynamicsmentioning
confidence: 99%
“…From the observed dynamics, trapping processes occurring on picosecond time scales can be identified (Jepsen et al, 2001;Messner et al, 2001). Especially in materials that possess a low degree of crystallinity or porous materials, the conduction pathway can be significantly obstructed, resulting in the localization of charge carriers.…”
Section: Ultrafast Dynamicsmentioning
confidence: 99%
“…It can be seen that the carrier lifetime increases with excitation fluence for all nanowire samples, suggesting the existence of trap states that begin to saturate toward higher photoinjected carrier density. 11 In order to assess the effects of both overcoating and defect-free growth, we constructed a model that accounts for both trapping of charges and other, nonsaturable, freecharge annihilation routes. While the process of overcoating will have a significant impact on the density of available surface states, a change in growth conditions for the GaAs core will mainly affect the nonsaturable charge recombination pathways.…”
mentioning
confidence: 99%
“…THz pulses are essentially single cycle electromagnetic pulses of about 1 ps duration. The transmitted field strength E t is measured directly in the time domain, through electrooptical sampling with 800 nm, 150 fs pulses: This ''gating'' technique provides a time resolution significantly better than the 1 ps THz pulse width [16]. Exciting MEH-PPV above the absorption gap ( 2:5 eV [5]) using 266 nm (4.5 eV) or 400 nm (3 eV), 150 fs pulses, allows investigation of photoexcited species.…”
mentioning
confidence: 99%