Ultrafast PBTI characterization on Si-free gate last Ge nFETs with stable and ultrathin Al&lt;inf&gt;2&lt;/inf&gt;O&lt;inf&gt;3&lt;/inf&gt; IL

Joishi, Chandan; Kothari, Shraddha; Ghosh, Sayantan; Mukhopadhyay, Subhadeep; Mahapatra, S.; Lodha, Saurabh

doi:10.1109/irps.2017.7936332

2017 IEEE International Reliability Physics Symposium (IRPS) 2017

DOI: 10.1109/irps.2017.7936332

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Ultrafast PBTI characterization on Si-free gate last Ge nFETs with stable and ultrathin Al<inf>2</inf>O<inf>3</inf> IL

Chandan Joishi

Shraddha Kothari

Sayantan Ghosh

et al.

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Ultrafast PBTI characterization on Si-free gate last Ge nFETs with stable and ultrathin Al<inf>2</inf>O<inf>3</inf> IL

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References 32 publications

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