2009
DOI: 10.1063/1.3193538
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Ultrafast pulse characterization using cross phase modulation in silicon

Abstract: Based on the high nonlinearity of the chip-scale silicon waveguide with small dispersion, a compact frequency-resolved optical gating system has been demonstrated using cross phase modulation for ultrafast pulse characterization. The principal component generalized projections algorithm is used to retrieve the amplitude and phase from the spectrogram. Amplitude and phase of a 540 fs pulse have been measured. The measured amplitude result is confirmed by the autocorrelation measurement.

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Cited by 31 publications
(16 citation statements)
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“…This demonstration opens the door to realizing fully integrated devices capable of measuring ultra-fast near-infrared pulses on a silicon chip. 10…”
Section: Resultsmentioning
confidence: 99%
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“…This demonstration opens the door to realizing fully integrated devices capable of measuring ultra-fast near-infrared pulses on a silicon chip. 10…”
Section: Resultsmentioning
confidence: 99%
“…However, an integrated chip-based pulse measurement device that is capable of singleshot measurements, without the need for a reference pulse, averaging or some external instrumentation that is difficult to integrate, such as an optical spectrum analyser or a long tunable delay line, is still lacking. While several groups have replicated all-optical techniques on a chip [9][10][11][12] that are well established in free-space or fiber-optics, such as autocorrelation, frequency-resolved optical gating (FROG), or temporal sampling, with obvious benefits in footprint, energy consumption and performance, all of the demonstrations fall short in one of the aforementioned points. A fully integrated pulse-measurement technology is nonetheless highly attractive, enabling the complete integration of pulse-generation, optical processing and measurement schemes on a single chip.…”
mentioning
confidence: 99%
“…In contrast, the finite-difference time-domain method (FDTD) potentially offers higher resolution and accuracy of reconstructed images due to the fact that it carries all the information about the phase and coherence of the wavefront [16]. Furthermore, new ultrafast technologies have been developed for the measurement of ultrafast optical pulses in both amplitude and phase such as Frequency Resolved Optical Gating (FROG) [17][18], time lens based on nonlinear parametric conversion [19], and Spectral Phase Interferometry for Direct Field Reconstruction (SPIDER) [20][21]. With advent of these new ultrafast measurement technologies, the imaging reconstruction algorithms are also necessary to step forward to achieve optical images with higher spatial resolutions and higher image contrasts.…”
Section: Introductionmentioning
confidence: 99%
“…These developments are creating a growing and compelling need for ultrafast coherent optical pulse measurement techniques that can operate at milliwatt peak power levels and on timescales ranging from sub-picoseconds to nanoseconds. Previous reports of ultrafast optical signal measurements in integrated, CMOS compatible platforms include time-lens temporal imaging and waveguide-based frequency-resolved optical gating (FROG) [1,[7][8][9][10]. These approaches indeed transferred in the integrated domain two popular methods [1,11,12] for ultrafast pulse measurement; however, time-lens imaging is phase-insensitive while waveguide-based FROG methods require long integrated tunable delay lines -still an unsolved challenge for the full integration of the technique.…”
Section: Introductionmentioning
confidence: 99%