“…Figure 4d presents the EQE of the SnTe:Si/Si and SnTe/Si devices measured at room temperature (300 K) as a function of light intensity for the 850 nm light. The EQE is defined as the ratio of the number of charge carriers collected by the device to the number of photons shining on the active area from the exterior laser: [
36 ]
where I ph, ∅, h , ν, and P in represent the photocurrent, number of incident photons, Planck's constant, frequency of the incident light, and incident light power on the active area of the device, [
37 ] respectively. For the SnTe/Si device in Figure 4d, a maximum EQE of 75% is observed at a light intensity of 2.1 mW cm −2 .…”