The ultra-intense, ultra-short X-ray pulses provided by X-ray Free Electron Laser (XFEL) sources are ideally suited to time resolved studies of structural dynamics with spatial resolution from nanometre to atomic length scales and temporal resolution of 10 fs or less. Using coherent X-ray diffraction as a diagnostic, XFELs enable the capturing of X-ray snapshots of previously unmeasurable transient phenomena, and the study of ultrafast processes such as sample damage on the timescales which they occur. With enough photons in a single pulse to enable single-shot measurements, and short enough pulses to freeze atomic motion, researchers now have a new window into the time evolution ultrafast phenomena that are intrinsically not cyclic in nature. In this review paper we recap some of the key time-resolved imaging experiments performed at FLASH and look ahead to a new generation of experiments at higher resolution using a new generation of new XFEL sources that are only just becoming available.