2021
DOI: 10.1002/adom.202100258
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Ultrafast Terahertz Nanoseismology of GaInN/GaN Multiple Quantum Wells

Abstract: Terahertz (THz) emission spectroscopy and microscopy are applied to investigate the electron and lattice dynamics of Ga0.8In0.2N/GaN multiple quantum wells (MQWs). The THz emission consists of three distinct, differently timed signals, whose physical mechanisms are attributed to i) laser‐induced ultrafast dynamical screening of built‐in bias electric field in MQWs followed by ii) capacitive charge oscillation of the excited carriers and iii) the coherent acoustic phonon (CAP)‐driven polarization surge at the d… Show more

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Cited by 10 publications
(3 citation statements)
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“…Moreover, the observed decay time of the 4th harmonic revealed a velocity exceeding 40 nm ps −1 . Furthermore, Mannan et al conducted a detailed investigation on the emission mechanism and propagation properties of acoustically generated THz phonons within a piezoelectric medium [144]. They specifically focused on the multiple quantum well (MQW) systems and explored the phenomenon of coherent acoustic phonon propagation.…”
Section: Thz Detectorsmentioning
confidence: 99%
“…Moreover, the observed decay time of the 4th harmonic revealed a velocity exceeding 40 nm ps −1 . Furthermore, Mannan et al conducted a detailed investigation on the emission mechanism and propagation properties of acoustically generated THz phonons within a piezoelectric medium [144]. They specifically focused on the multiple quantum well (MQW) systems and explored the phenomenon of coherent acoustic phonon propagation.…”
Section: Thz Detectorsmentioning
confidence: 99%
“…We have applied them to the SiC-MOS and obtained useful information [22]. In multiple quantum well structures GaInN/GaN, we can characterize carrier dynamics in the wells and capping layers [24].…”
Section: Various Devicesmentioning
confidence: 99%
“…We have applied TES and LTEM to Si-based materials and devices and proven that one can estimate various parameters, such as surface potential, work function, impurity doping density, defects density in passivation layers, surface state density, and so on, semi-quantitatively and non-contactly by just observing the THz radiation [8][9][10][11][12][13][14][15][16][17]. In the present work, we review the TES and LTEM application to wide bandgap semiconductors [18][19][20][21][22][23][24].…”
Section: Introductionmentioning
confidence: 99%