2018
DOI: 10.1016/j.optmat.2017.12.023
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Ultrafast third-order optical nonlinearity in SnS 2 layered compound for photonic applications

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Cited by 10 publications
(5 citation statements)
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“…The camera calibration procedure and the image processing method, used in our THG experiments, were introduced by us. They are described in detail in and utilized by us in the investigation by THG of the ultrafast nonlinear response of SnS 2 and GaN. , …”
Section: Experimental Sectionmentioning
confidence: 99%
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“…The camera calibration procedure and the image processing method, used in our THG experiments, were introduced by us. They are described in detail in and utilized by us in the investigation by THG of the ultrafast nonlinear response of SnS 2 and GaN. , …”
Section: Experimental Sectionmentioning
confidence: 99%
“…They are described in detail in 20 and utilized by us in the investigation by THG of the ultrafast nonlinear response of SnS 2 and GaN. 21,22 Spectroscopic Characterization. The optical transmission measurements were performed using a Varian Cary 5000 UV−vis− NIR spectrophotometer at room temperature in the 200−2000 nm range.…”
Section: ■ Introductionmentioning
confidence: 99%
“…As carriers, the NLO materials play an important role in achieving OL functionality [ 11 ]. There is a wide range of materials that can be used for optical limiting, such as organic polymers [ 12 ], inorganic metal compounds [ 13 ], and composites [ 14 ]. For several years, researchers have been attempting to explore new NLO materials with larger modulation depths, lower initial limiting thresholds, faster response times, and wider response wavebands.…”
Section: Introductionmentioning
confidence: 99%
“…In this paper, the ultrafast third-order optical nonlinearity of c-plane GaN crystal, excited by ultrashort (fs) high-repetition-rate laser pulses at 1550 nm wavelength, is investigated for the first time by optical THG in non-phase-matching conditions and the corresponding third-order nonlinear optical susceptibility is determined. The very low average power of the third harmonic beam generated in GaN (~pW) is measured by image processing, following a method recently introduced by us for the use of a common camera as an ultrasensitive power-meter [35,36].…”
Section: Introductionmentioning
confidence: 99%