Ultrahigh Energy Heavy Ion Test Beam on Xilinx Kintex-7 SRAM-Based FPGA

Du, Boyang; Sterpone, Luca; Azimi, Sarah; Codinachs, David Merodio; Ferlet-Cavrois, V.; Polo, Cesar Boatella; Alía, Rubén García; Kastriotou, Maria; Fernández-Martínez, P.

doi:10.1109/tns.2019.2915207

Cited by 30 publications

(14 citation statements)

References 16 publications

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“…Shapes shown in Tables V-VIII are very similar to those observed by other authors after irradiating a 28-nm Xilinx Kintex-7 SRAM-based FPGA under ultrahigh energy heavy ions [27]. This is not surprising since both devices belong to the same generation of 28-nm Xilinx's SRAM-based FPGAs.…”

Section: E Hypothetical Shape Of Mcussupporting

confidence: 85%

Single Event Upsets Under 14-MeV Neutrons in a 28-nm SRAM-Based FPGA in Static Mode

Fabero

Mecha

Franco

et al. 2020

IEEE Trans. Nucl. Sci.

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A sensitivity characterization of a Xilinx Artix-7 FPGA against 14.2 MeV neutrons is presented. The content of the internal SRAMs and flip-flops were downloaded in a PC and compared with a golden version of it. Flipped cells were identified and classified as cells of the configuration RAM, BRAM, or flip-flops. SBUs and MCUs with multiplicities ranging from 2 to 8 were identified using a statistical method. Possible shapes of multiple events are also investigated, showing a trend to follow wordlines. Finally, MUSCA SEP3 was used to make assesment for actual environments and an improvement of SEU injection test is proposed.

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Section: E Hypothetical Shape Of Mcussupporting

confidence: 85%

Single Event Upsets Under 14-MeV Neutrons in a 28-nm SRAM-Based FPGA in Static Mode

Fabero

Mecha

Franco

et al. 2020

IEEE Trans. Nucl. Sci.

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“…Attention should be paid to this in the hardening design. Similar results for the multi-bit upsets were also discovered in the 28 nm Kintex-7 FPGA, though the LET values used in the irradiation test were not high [16].…”

Section: Analysis Of the Radiation Sensitivitysupporting

confidence: 74%

Section: Development Of the See Evaluation Methodsmentioning

confidence: 99%

“…Thus, the SEE evaluation based on the FPGA evaluation platform has advantages in time and cost. The related test logics were created in the Kintex-7 evaluation platform in previous work [15,16]. These logics allows multiple design instances to be flexibly tested in parallel, increasing the rate of data acquisition in the radiation test [15,16].…”

Section: Development Of the See Evaluation Methodsmentioning

confidence: 99%

“…Meanwhile, the expression of these upsets in bitstreams is usually a single bit error. The ~10 −3 cm 2 /bit to ~10 −2 cm 2 /bit SEFI crosssection results for the DUT were more severe than the other FPGAs with large feature size, which should be concerning for its influence in a radiation environment [6][7][8]13,15,16].…”

Section: Analysis Of the Radiation Sensitivitymentioning

confidence: 99%

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SEE Sensitivity Evaluation for Commercial 16 nm SRAM-FPGA

et al. 2019

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Radiation effects can induce severe and diverse soft errors in digital circuits and systems. A Xilinx commercial 16 nm FinFET static random-access memory (SRAM)-based field-programmable gate array (FPGA) was selected to evaluate the radiation sensitivity and promote the space application of FinFET ultra large-scale integrated circuits (ULSI). Picosecond pulsed laser and high energy heavy ions were employed for irradiation. Before the tests, SRAM-based configure RAMs (CRAMs) were initialized and configured. The 100% embedded block RAMs (BRAMs) were utilized based on the Vivado implementation of the compiled hardware description language. No hard error was observed in both the laser and heavy-ion test. The thresholds for laser-induced single event upset (SEU) werẽ 3.5 nJ, and the SEU cross-sections were correlated positively to the laser's energy. Multi-bit upsets were measured in heavy-ion and high-energy laser irradiation. Moreover, latch-up and functional interrupt phenomena were common, especially in the heavy-ion tests. The single event effect results for the 16 nm FinFET process were significant, and some radiation tolerance strategies were required in a radiation environment.of commercial-off-the-shelf (COTS) in the field of integrated circuits (IC) have enabled the use of inexpensive and high-performance electronic components that also contributes to the space industry [9].As reported in Reference [9,10], in CubeSats or many commercial missions, using COTS components is becoming the rule rather than an exception, and many COTS are complicated systems. However, to reduce risks in the radiation environment, identifying the sensitive and the essential modules for a hardening designer is necessary. The Xilinx Ultrascale + FPGA has excellent performance and large storage capacity and it is hugely appealing in data handling. However, the SEU influence and FPGA response are more complicated due to their small feature size, high performance, and special charge collection mechanisms in a radiation environment [3]. Apart from the fault injection in the designing procedure, the irradiation results are more direct and effective to characterize the sensitivity of FPGA. Though several details about alpha particles, neutrons, and protons were reported, the heavy-ion and laser irradiation results are very limited for the CRAM and BRAM module in Ultrascale + FPGA. Moreover, systematic SEE results are essential for the module's potential applications in the radiation environment [11]. Further, FPGA irradiation data will have a guiding significance for logic protections in the design flow and utilization of error mitigation strategies at a system level [1,3].The paper is organized as follows: The device under test (DUT) and testing methods are provided in Section 2. We describe the irradiation parameters and experimental details in Section 3. The heavy-ion and pulse laser irradiation results are presented in Section 4 and further discussion about the application and error mitigation strategies are shown in Section 5. Finally,...

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Soft-Error Analysis of Self-reconfiguration Controllers for Safety Critical Dynamically Reconfigurable FPGAs

Bozzoli

Sterpone

2020

Applied Reconfigurable Computing. Architectures, Tools, and Applications

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Ultrahigh Energy Heavy Ion Test Beam on Xilinx Kintex-7 SRAM-Based FPGA

Cited by 30 publications

References 16 publications

Single Event Upsets Under 14-MeV Neutrons in a 28-nm SRAM-Based FPGA in Static Mode

Single Event Upsets Under 14-MeV Neutrons in a 28-nm SRAM-Based FPGA in Static Mode

SEE Sensitivity Evaluation for Commercial 16 nm SRAM-FPGA

Soft-Error Analysis of Self-reconfiguration Controllers for Safety Critical Dynamically Reconfigurable FPGAs

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