2022
DOI: 10.1016/j.apsusc.2022.153221
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Ultralow secondary electron emission and improved vacuum surface insulation of polyimide with scalable nanocomposite coating

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Cited by 26 publications
(20 citation statements)
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“…Sub-surface charge migration is regulated by the trap states, which affects the above-surface process of flashover development, including SEEA, surface charging, and outgassing, and ultimately determines the surface insulation. On the one hand, the trap density and energy levels could affect the SEY by changing the trapping escape mean free path and probability of the internal SEs excited by the incident electrons (Figure d). , It has been demonstrated that the increase in trap density always yields lower SEE for a positively charged dielectric surface, which is preferable for better surface insulation. Deep trap states mainly impede surface charge emission to alleviate the surface charging and hence increase flashover voltage, which is more pronounced with higher deep trap state density and the trap energy level.…”
Section: Resultsmentioning
confidence: 99%
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“…Sub-surface charge migration is regulated by the trap states, which affects the above-surface process of flashover development, including SEEA, surface charging, and outgassing, and ultimately determines the surface insulation. On the one hand, the trap density and energy levels could affect the SEY by changing the trapping escape mean free path and probability of the internal SEs excited by the incident electrons (Figure d). , It has been demonstrated that the increase in trap density always yields lower SEE for a positively charged dielectric surface, which is preferable for better surface insulation. Deep trap states mainly impede surface charge emission to alleviate the surface charging and hence increase flashover voltage, which is more pronounced with higher deep trap state density and the trap energy level.…”
Section: Resultsmentioning
confidence: 99%
“…Finally, V app is decreased step by step (1 kV each step) until no flashover occurred under each pulse, noted as the hold-off voltage ( U ho ). A standard three-electrode system (8009 resistivity test fixture) connected to a high-resolution electrometer (Keithley 6517B) was used to test the surface resistivity. , …”
Section: Methodsmentioning
confidence: 99%
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“…Kelvin probe is always perpendicular to the sample plane with a ~2 mm fixed space between the probe and the sample surface to acquire a high resolution during the whole scanning process. The scanning trajectory of the probe is a zigzag scanning route and covers a region of 40 � 30 mm at the sample surface after a certain impulse number N. More details of the experiment system and measurement procedures can be found in our previous study [46]. It is worth mentioning that the dissipation of surface charge in vacuum can be neglected during the complete scanning process of 5 min.…”
Section: Characterisationmentioning
confidence: 99%