2017
DOI: 10.1002/celc.201700968
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Ultrasensitive, Sustainable, and Selective Electrochemical Hydrazine Detection by ALD‐Developed Two‐Dimensional WO3

Abstract: Wafer‐scale two‐dimensional (2D) WO3 films with different thicknesses of 0.78, 1.4, 3.6, and 6.5 nm were fabricated on Au‐SiO2/Si substrates using an atomic layer deposition technique. Their surface morphologies and chemical components were examined by field‐emission scanning electron microscopy, atomic force microscopy and X‐ray photoelectron spectroscopy. Cyclic voltammetry, chronoamperometry and electrochemical impedance spectroscopy were utilized for the analysis of the electrochemical behavior of 2D WO3 f… Show more

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Cited by 18 publications
(6 citation statements)
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“…The correlated linear regression equation could be presented as follows: E P (V) = 0.0671 log ν + 0.278. For the diffusion-controlled process mentioned above, E P can be defined by the following Tafel equation [9]:…”
Section: H 2 O 2 Sensing Propertiesmentioning
confidence: 99%
See 1 more Smart Citation
“…The correlated linear regression equation could be presented as follows: E P (V) = 0.0671 log ν + 0.278. For the diffusion-controlled process mentioned above, E P can be defined by the following Tafel equation [9]:…”
Section: H 2 O 2 Sensing Propertiesmentioning
confidence: 99%
“…First of all, ALD is the only one technology, which enables fabrication of conformal, defect-free semiconductor 2D nano-films and their heterostructures on the wafer scale with precise control of their thickness during fabrication at the Ångstrom level [8]. In this regard, state-of-the-art nanoscale interfacing and molecular engineering of the sensing electrode materials can open up completely new possibilities by providing ultra-thin channels for key doping, minimization of the density of interfacial impurities and optimization of sensing capabilities of the devices [9]. Several recent reports about ALD-developed wafer-scaled monolayers of WO 3 [8,10,11] and TiO 2 [12,13] and few-layered MoO 3 [14,15], TiO 2 [16], and their heterojunctions including Au-WO 3 -TiO 2 [17], Ga 2 O 3 -WO 3 [18], Au-Ga 2 O 3 -TiO 2 [19], etc.…”
Section: Introductionmentioning
confidence: 99%
“…It has also been employed in modern different gas sensors [14][15][16]. In order to fabricate miniaturized and reliable SnO 2 -and In 2 O 3 -based hetero-structured SEs the following technological approaches have recently been proposed: sol-gel [17], solvothermal [18], microwave methods [19,20], spray pyrolysis [21], coaxial electrospinning [22], impregnation [23], hydrothermal deposition [24], ALD and PE-ALD [25][26][27][28][29], chemical vapor deposition (CVD) [30] and sputtering [31]. All these techniques can produce the SE crystalline size within the nm scale strengthening the influence of crystalline shape on the adsorption properties, which determine both gas sensitivity and selectivity.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, both shape and size of the developed nanocrystals regulate the type of binding to the SE surface and ultimately impact the amount of adsorbed gaseous species [13]. Among all fabrication techniques mentioned above, ALD or PE-ALD is a thin-film deposition method based on alternating, self-limiting chemical reactions between the gaseous precursors and solid substrate surface [26]. It can produce high quality, uniform and conformal SE even at the low fabrication temperatures [13,28,[31][32][33][34][35].…”
Section: Introductionmentioning
confidence: 99%
“…These materials are expected to combine multiple sensing and stimulation functionalities and simultaneously create chronic biocompatible interfaces with neural cells and brain tissue. In this regard, 2D nanomaterials are among the main advanced atomically thin nanostructures that hold great promise for the development of highly active and miniaturized sensors [ 49 , 50 , 51 , 52 ]. Due to their high surface area, easy functionalization and exceptional electronic characteristics, 2D nanostructures are among the main options for the development of novel neural interface sensors [ 3 , 53 , 54 , 55 , 56 , 57 ].…”
Section: Introductionmentioning
confidence: 99%