2001
DOI: 10.1007/s003390000596
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Ultrashort-pulse laser ablation of indium phosphide in air

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Cited by 251 publications
(130 citation statements)
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“…11 Very recently, the formation of subwavelength-sized ripples has been reported by Borowiec and Haugen for the irradiation of various compound semiconductors, including InP by 50-130 fs laser pulses at several wavelengths (800, 1300, and 2100 nm) and for typically between 1 and 100 pulses per spot. 14 Near the ablation threshold, these authors reported the formation of highspatial-frequency LIPSS (HSFL), with lateral periods 4.2-5.1 times smaller than the wavelength of the incident light, only when the laser photon energy is below the band-gap energy of the target materials.…”
Section: Introductionmentioning
confidence: 89%
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“…11 Very recently, the formation of subwavelength-sized ripples has been reported by Borowiec and Haugen for the irradiation of various compound semiconductors, including InP by 50-130 fs laser pulses at several wavelengths (800, 1300, and 2100 nm) and for typically between 1 and 100 pulses per spot. 14 Near the ablation threshold, these authors reported the formation of highspatial-frequency LIPSS (HSFL), with lateral periods 4.2-5.1 times smaller than the wavelength of the incident light, only when the laser photon energy is below the band-gap energy of the target materials.…”
Section: Introductionmentioning
confidence: 89%
“…In a previous study it has been shown that in InP, irradiated under similar experimental conditions ( 0 = 0.58 J / cm 2 , N = 100), the ablated area also increases logarithmically with N which is a consequence of damage accumulation effects. 11 After reaching a nearly constant value ͑N =8-20͒, the Fourier amplitudes fall off again when the LSFL peak starts to blur out ͑N Ͼ 20-30͒. Simultaneously, at those high pulse numbers, a characteristic pattern of grooves which is perpendicular to the ripple structures starts to develop from the center of the irradiated regions [see the starshaped symbols in Fig.…”
Section: B Ripple Formationmentioning
confidence: 99%
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“…1 Recently, the behavior of this material upon irradiation with femtosecond laser pulses has been studied by different groups using complementary in situ [2][3][4] and ex situ techniques. [5][6][7][8][9][10][11][12][13] During the course of these experiments, a particular morphological feature has been observed by two different groups in the singlepulse ablation regime whose origin has not been unambiguously identified yet. 6,11 In a previous publication, some of us reported a characteristic permanent ring pattern in the ablation craters which exhibited a threshold behavior and which was related to a local recrystallization process of the residual melt pool on the semiconductor surface.…”
Section: Introductionmentioning
confidence: 99%
“…This result can be formulated in an equivalent alternative way: the single-pulse threshold fluence for ablation decreases with the number of prior laser pulses ͑ac-cumulated fluence͒ applied to the same spot. In fact, it is well documented 19,36,37 for several dielectric and semiconductor crystals that the damage threshold under femtosecond-pulsed laser irradiation decreases with the number of pulses. All those features are again indicative of the cumulative character of the damage.…”
Section: B Train Of Pulses: Damage Accumulation and Incubation Fluencementioning
confidence: 99%