2003
DOI: 10.1063/1.1530351
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Ultrashort-pulse reflectometry for steady-state plasmas

Abstract: Design of an X-mode fast-scanning reflectometry for edge density profile measurement on HT-7 tokamak Rev. Sci. Instrum. 74, 1522 (2003; 10.1063/1.1527253 Millimeter-wave reflectometry for electron density profile and fluctuation measurements on NSTX Rev. Sci. Instrum. 72, 348 (2001); 10.1063/1.1329657 Ultrashort pulse reflectometry for electron density profile measurements on SSPX Rev. Sci. Instrum. 72, 332 (2001); 10.1063/1.1308999Preliminary electron density profile and fluctuation measurements on GAMMA 10 u… Show more

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