2013
DOI: 10.1063/1.4795010
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Ultrathin magnetic oxide EuO films on Si(001) using SiOx passivation—Controlled by hard x-ray photoemission spectroscopy

Abstract: Multilayer approach to the quantitative analysis of x-ray photoelectron spectroscopy results: Applications to ultrathin Si O 2 on Si and to self-assembled monolayers on gold

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Cited by 27 publications
(32 citation statements)
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“…The major experimental difficulty relies in synthesizing the metastable oxide EuO in its stoichiometric ferromagnetic phase since off-stoichiometry precludes an epitaxial growth and also reduces ferromagnetic exchange in the ultrathin-film limit, which is, however, essential for efficient spin-filter tunneling. [13][14][15][16][17] In recent years, several growth studies on EuO thin films have been presented, in particular on stoichiometric EuO thin films grown coherently on perfectly lattice-matched yttriastabilized zirconia (YSZ) 14,18 and on different cubic oxides with only a few percent tensile lattice strain. 19,20 The system EuO/MgO (001), however, provides a large compressive lattice mismatch of m = (a MgO − a EuO )/a EuO = −18%.…”
Section: Introductionmentioning
confidence: 99%
“…The major experimental difficulty relies in synthesizing the metastable oxide EuO in its stoichiometric ferromagnetic phase since off-stoichiometry precludes an epitaxial growth and also reduces ferromagnetic exchange in the ultrathin-film limit, which is, however, essential for efficient spin-filter tunneling. [13][14][15][16][17] In recent years, several growth studies on EuO thin films have been presented, in particular on stoichiometric EuO thin films grown coherently on perfectly lattice-matched yttriastabilized zirconia (YSZ) 14,18 and on different cubic oxides with only a few percent tensile lattice strain. 19,20 The system EuO/MgO (001), however, provides a large compressive lattice mismatch of m = (a MgO − a EuO )/a EuO = −18%.…”
Section: Introductionmentioning
confidence: 99%
“…23 Analysis of the EELS line shape can thus produce atomic-resolution information about the oxidation state and bonding information of the constituent species present. [24][25][26][27] While other techniques including X-ray absorption spectroscopy 4,12,28 and hard X-ray photoemission spectroscopy 29 have detected the presence of multiple europium valence states in EuO 1±δ films, electron microscopy is uniquely poised to investigate variations in the interface structure at the atomic scale, which are not discernable by bulk characterization. Transmission electron microscopy on EuO is challenging due to its reactivity with air and we are aware of only one report of its use, 4 though no images were shown in that report.…”
mentioning
confidence: 99%
“…Being doped, though, at high temperature, these materials typically enter into dominant states that are not spatially homogeneous due to formation of magnetic polarons -few-body systems comprised of electron and local magnetic moments of the host [20,[24][25][26][27]. However, this unwanted formation does not take place when magnetisation of the lattice is significant, leaving the host material perfectly homogeneous in the region of its employment as a spin injector [25][26][27].Owing its outstanding magnetic and transport properties among other MS, EuO has recently attracted much attention as having tremendous potential for semiconductor spintronics, in particular, when integrated with Si [18,[28][29][30]. Not only does doped EuO exhibit a spin polarization close to 100% due to enormous (~0.6 eV) spin splitting of its conduction band but also it can be conductance-matched with Si by doping with oxygen vacancies or trivalent rare-earth atoms such as Gd, La or Lu [18,[30][31][32][33].…”
mentioning
confidence: 99%
“…An intermediate layer, however, reduces the probability of spin-polarized carriers injection exponentially. In particular, an enormous band gap of about 6 eV in SrO makes injection of spin-polarized carriers into Si rather ineffective.The continuing attempts to grow EuO/Si heterojunctions [28][29][30]43,44] are checked by the presence of large amounts of impurity phases at the interface. These phases are not only detrimental to the growth of EuO films; they also prevent spin injection due to spin-flip scattering.…”
mentioning
confidence: 99%
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