Ultraviolet Fluorescence Bleaching Rates for New Cell Cracks

Hobbs, William B.; Johnston, Steve; Gilleland, Braden

doi:10.1109/pvsc45281.2020.9300580

Cited by 5 publications

(1 citation statement)

References 6 publications

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“…Ring patterns with dim fluorescence in the center can show dark crack lines, as shown in [12]. The width of UVF lines can correlate to the age of the cracks [30], although the width of a line can vary along the length of a single crack, indicating that there are other factors that determine the width. Possibly, cracks with wider gaps allow more oxygen diffusion.…”

Section: Cracksmentioning

confidence: 99%

Ultraviolet Fluorescence Imaging for Photovoltaic Module Metrology: Best Practices and Survey of Features Observed in Fielded Modules

Colvin,

Gabor,

Oltjen

et al. 2024

Preprint

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As the photovoltaics (PV) industry grows in sophistication, so must the extent to which systems are characterized. UV Fluorescence (UVF) imaging is a valuable, easy-to-perform, high throughput, non-intrusive technique for characterizing modules in the field and in the lab. However, UVF is still a relatively new technique, and many in the PV industry are still unaware of its potential. We provide a guideline for obtaining, processing, and interpreting UVF images. We have provided a list of considerations for imaging hardware and settings, a suggested pipeline for image processing, and details on a survey of features shown in UVF images. A database with UVF images of 7,190 modules is provided in https://osf.io/t8x9k/. A database curated by BrightSpot Automation is available on https://brightspotautomation.com/publications/.

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Section: Cracksmentioning

confidence: 99%