Abstract:Abstract-Advanced process control (APC) has been recognized as a proper tool for maximizing profitability of semiconductor manufacturing facilities by improving efficiency and product quality. Run-to-run (RtR) process control with good quality and reliable performance for APC applications are most applicable. This paper proposes a new RtR control scheme, tool based disturbance estimator (TBDE) control scheme, which is adaptive to the mixed product overlay processes. The TBDE control scheme which employs thread… Show more
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