2024
DOI: 10.1101/2024.07.05.602172
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Uncertainty-Aware Traction Force Microscopy

Adithan Kandasamy,
Yi-Ting Yeh,
Ricardo Serrano
et al.

Abstract: Traction Force Microscopy (TFM) is a versatile tool to quantify cell-exerted forces by imaging and tracking fiduciary markers embedded in elastic substrates. The computations involved in TFM are ill-conditioned, and data smoothing or regularization is required to avoid overfitting the noise in the tracked substrate displacements. Most TFM calculations depend critically on the heuristic selection of regularization (hyper)parameters affecting the balance between overfitting and smoothing. However, TFM methods ra… Show more

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