Uncertainty evaluation of displacements measured by electronic speckle-pattern interferometry

Cordero, Raúl R.; Martı́nez, Amalia; Rodrı́guez-Vera, Ramón; Roth, Pedro

doi:10.1016/j.optcom.2004.07.040

Cited by 23 publications

(18 citation statements)

References 13 publications

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“…With the very weak value of d z during tensile test, justifying in passing the non necessity to employ a telecentric lens, this contribution appears to be less than 1/100 of a fringe. Consequently, errors on ESPI interferometer sensitivity due to collimation absence are estimated as insignificant and this aspect was also demonstrated by Cordero et al in [32].…”

Section: Methodssupporting

confidence: 58%

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Localisation Phenomenon Investigation on SMATed Stainless Steel Samples by Speckle Interferometry

Petit¹,

Montay²,

François³

2011

Strain

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In‐plane Electronic Speckle Pattern Interferometry (ESPI) has been successfully used during tensile tests on SMA‐treated (Surface Mechanical Attrition Treatment) and as‐received 316L stainless steel in order to measure the strain rate field. The heterogeneity in the strain rate field can be observed from a stage of deformation which doesn’t coincide with the classic Considère’s criterion (dF = 0) for the diffuse neck initiation (or plastic instability). The initiation of this heterogeneity strongly depends on treatments undergone by the material. In this paper, a comparison was performed about the heterogeneity initiation of specimens SMATed during 30 min with 2 mm shot, 3 mm shot and a non‐treated sample. The formation of the two slip band system until fracture of the tensile specimen was also studied.

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Section: Methodssupporting

confidence: 58%

“…Consequently, errors on ESPI interferometer sensitivity due to collimation absence are estimated as insignificant and this aspect was also demonstrated by Cordero et al. in [32].…”

Section: Methodssupporting

confidence: 57%

Localisation Phenomenon Investigation on SMATed Stainless Steel Samples by Speckle Interferometry

Petit¹,

Montay²,

François³

2011

Strain

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“…Better ray tracing performance can be achieved by using a more realistic behavior of the optical system as proposed by Lin et al [ 21 ]. Third, systematic error arising from uncertainty of the nominal sensitivity vector directions due to optical system misalignments can reduce measurement accuracy [ 22 ]. The commercial ESPI used for this work had a fixed optical geometry for which we had inexact specifications, so there is some uncertainty in the parameters used for the calculations (i.e., position of the light source and view point).…”

Section: Discussionmentioning

confidence: 99%

Compensation method for obtaining accurate, sub-micrometer displacement measurements of immersed specimens using electronic speckle interferometry

Fazio

Bruno

Reynaud

et al. 2012

Biomed. Opt. Express

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We proposed and validated a compensation method that accounts for the optical distortion inherent in measuring displacements on specimens immersed in aqueous solution. A spherically-shaped rubber specimen was mounted and pressurized on a custom apparatus, with the resulting surface displacements recorded using electronic speckle pattern interferometry (ESPI). Point-to-point light direction computation is achieved by a ray-tracing strategy coupled with customized B-spline-based analytical representation of the specimen shape. The compensation method reduced the mean magnitude of the displacement error induced by the optical distortion from 35% to 3%, and ESPI displacement measurement repeatability showed a mean variance of 16 nm at the 95% confidence level for immersed specimens. The ESPI interferometer and numerical data analysis procedure presented herein provide reliable, accurate, and repeatable measurement of sub-micrometer deformations obtained from pressurization tests of spherically-shaped specimens immersed in aqueous salt solution. This method can be used to quantify small deformations in biological tissue samples under load, while maintaining the hydration necessary to ensure accurate material property assessment.

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“…Description of the error on phase extraction has been provided by Cordero [7]; postprocessing derivation has been investigated in the same way [8]. Beside these two general purpose works, a study on 3D ESPI leads to an optimal position of illumination vectors [9].…”

Section: Introductionmentioning

confidence: 99%

Uncertainty on fringe projection technique: A Monte-Carlo-based approach

Molimard

Navarro

2013

Optics and Lasers in Engineering

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Error estimation on optical full field techniques (OFFT) is millstone in the diffusion of OFFT. The present work describes a generic way to estimate overall error in fringe projection, either due to random sources (phase error, basically related to the quality of the camera and of the fringe extraction algorithm) or the bias (calibration errors). Here, a high level calibration procedure based on pinhole model has been implemented. This model compensates for the divergence effects of both the video-projector and the camera. The work is based on a Monte Carlo procedure. So far, the complete models of the calibration procedure and of a reference experiment are necessary. Here, the reference experiment consists in multiple step out-ofplane displacement of a plane surface. Main conclusions of this work are: 1/ the uncertainties in the calibration procedure lead to a global rotation of the plane, 2/ the overall error has been calculated in two situations; the overall error ranges from 104 µm down to 10 µm, 3/ the main error source is the phase error even if errors due to the calibration are not always negligible.

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Uncertainty evaluation of displacements measured by electronic speckle-pattern interferometry

Cited by 23 publications

References 13 publications

Localisation Phenomenon Investigation on SMATed Stainless Steel Samples by Speckle Interferometry

Localisation Phenomenon Investigation on SMATed Stainless Steel Samples by Speckle Interferometry

Compensation method for obtaining accurate, sub-micrometer displacement measurements of immersed specimens using electronic speckle interferometry

Uncertainty on fringe projection technique: A Monte-Carlo-based approach

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