“…The SEM (Thermofisher Helios 5CX, USA) equipped with an electron backscatter diffractometer (EBSD, EDAX HIKARI Super, USA) was used to perform EBSD scanning of the samples, and the EBSD data were post-processed on TSL-OIM software to obtain the grain size and TiB 2 particle distribution. The line interception method calculated the grain size (ASTM 112–10) [19] . The samples tested above were mechanically ground and polished according to standard metallographic techniques before testing, and the EBSD samples were additionally polished with a 0.5 μm particle size SiO 2 polishing solution for 3 h. It should be noted that the XRD data, SEM images, and OM images were all from the samples at the core of the ingot, and the top and bottom samples were only used to quantitatively analyze the concentrations of Cu and Ti elements inside the grains.…”